Agilent Technologies Signal Analyzer N9030a User Manual

Page 585

6 RLC Swept SA Measurement Front-Panel & SCPI Reference

FREQ Channel

Scope

Meas Global

Remote Command

[:SENSe]:FREQuency:OFFSet

[:SENSe]:FREQuency:OFFSet?

Example

FREQ:OFFS 10 MHz

Notes

Preset and Max values are dependent on Hardware Options (503, 507, 508, 513, 526)

Dependencies

Freq Offset is not available in External Mixing. In this case the Freq Offset key is grayed out and
shows a value of zero. However, the value of CF Offset that was set for the RF Input is retained
and restored when the user switches back to the RF Input.

Preset

See the table in See

"Center Frequency Presets" on page 574

State Saved

Saved in instrument state

Min

–500 GHz

Max

500 GHz

Default Unit

Status Bits/OPC
dependencies

Non-overlapped

Backwards
Compatibility SCPI

DISPlay:WINDow[1]:TRACe:X[:SCALe]:OFFSet

The DISPlay version of the command is in the instrument for compatibility across platforms and
is not recommended for new development.

Backwards Compatibility
Notes

1. In pre-X-Series instruments, Frequency Offset could not be adjusted by the knob or step keys.

That is no longer the case.

2. Some previous spectrum analyzers did not adjust frequency counter results for the Frequency

Offset. The X-Series does adjust the frequency counter for the offset.

Initial S/W Revision

Prior to A.02.00

Modified at S/W
Revision

A.04.00, A.08.50

More Information

This command does not affect any bandwidths or the settings of relative frequency parameters
such as delta markers or span. It does not affect the current hardware settings of the analyzer,
but only the displayed frequency values. Entering an offset does not affect the trace position or
display, just the value of the start and stop frequency and the values represented by the trace
data. The frequency values of exported trace data, queried trace data, markers, trace data used in
calculations such as N dB points, trace math, etc., are all affected by Freq Offset. Changing the

Remote Language Compatibility Measurement Application Reference

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