Agilent Technologies Signal Analyzer N9030a - Manual (Page 584)

6 RLC Swept SA Measurement Front-Panel & SCPI Reference
FREQ Channel
Dependencies Span, RBW, Center frequency
If the electronic/soft attenuator is enabled, any attempt to change the value of the center
frequency >3.6 GHz by pressing the Up-arrow key, fails and results in an advisory message. If the
equivalent SCPI command is sent, this same message is generated as part of a “–221, Settings
conflict” warning.
Couplings When auto-coupled in a non-zero span, the center frequency step size is set to 10% of the span.
When auto-coupled in zero span, the center frequency step size is set to the equivalent –3 dB
RBW value.
Preset Auto
ADEMOD: 1 MHz
ON
State Saved Saved in instrument state
Min – (the maximum frequency of the instrument). That is, 27 GHz max freq instrument has a CF
step range of +/– 27 GHz. Note that this is the maximum frequency given the current settings of
the instrument, so in External Mixing, for example, it is the maximum frequency of the current
mixer band.
Max The maximum frequency of the instrument. That is, 27 GHz max freq instrument has a CF step
range of +/– 27 GHz. Note that this is the maximum frequency given the current settings of the
instrument, so in External Mixing, for example, it is the maximum frequency of the current mixer
band.
Default Unit Hz
Status Bits/OPC
dependencies non-overlapped
Initial S/W Revision Prior to A.02.00
Modified at S/W
Revision A.03.00
Freq Offset
Enables you to set a frequency offset value to account for frequency conversions outside of the
analyzer. This value is added to the display readout of the marker frequency, center frequency,
start frequency, stop frequency, and all other absolute frequency settings in the analyzer including
frequency count. When a frequency offset is entered, the value appears below the center of the
graticule. To eliminate an offset, perform a Mode Preset or set the frequency offset to 0 Hz.
See "More Information" on page 585 .
Key Path FREQ Channel
584 Remote Language Compatibility Measurement Application Reference