4 breakpoint/test mode select (bkpt/tms), 7 test clock (tck), 16 test signals – Freescale Semiconductor MCF5480 User Manual
Page 100: 1 test mode (mtmod[3:0]), Breakpoint/test mode select (bkp, Test clock (tck) -30, Test signals -30, Test mode (mtmod[3:0]) -30
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![4 breakpoint/test mode select (bkpt/tms), 7 test clock (tck), 16 test signals | 1 test mode (mtmod[3:0]), Breakpoint/test mode select (bkp, Test clock (tck) -30, Test signals -30, Test mode (mtmod[3:0]) -30 | Freescale Semiconductor MCF5480 User Manual | Page 100 / 1032](/screens/111671/100.png)