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3 sample_preload; 0x2, 4 avr_reset; 0xc, 5 bypass; 0xf – Rainbow Electronics ATmega128RFA1 User Manual

Page 444: 5 boundary-scan chain, 1 scanning the digital port pins, Atmega128rfa1

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8266A-MCU Wireless-12/09

ATmega128RFA1

The active states are:

Capture-DR: Data in the IDCODE Register is sampled into the Boundary-scan

Chain.

Shift-DR: The IDCODE scan chain is shifted by the TCK input.

29.4.3 SAMPLE_PRELOAD; 0x2

Mandatory JTAG instruction for pre-loading the output latches and taking a snap-shot of
the input/output pins without affecting the system operation. However, the output
latches are not connected to the pins. The Boundary-scan Chain is selected as Data
Register.

The active states are:

Capture-DR: Data on the external pins are sampled into the Boundary-scan Chain.

Shift-DR: The Boundary-scan Chain is shifted by the TCK input.

Update-DR: Data from the Boundary-scan chain is applied to the output latches.

However, the output latches are not connected to the pins.

29.4.4 AVR_RESET; 0xC

The AVR specific public JTAG instruction for forcing the AVR device into the Reset
mode or releasing the JTAG reset source. The TAP controller is not reset by this
instruction. The one bit Reset Register is selected as Data Register. Note that the reset
will be active as long as there is a logic “one” in the Reset Chain. The output from this
chain is not latched.

The active states are:

Shift-DR: The Reset Register is shifted by the TCK input.

29.4.5 BYPASS; 0xF

Mandatory JTAG instruction selecting the Bypass Register for Data Register.

The active states are:

Capture-DR: Loads a logic “0” into the Bypass Register.

Shift-DR: The Bypass Register cell between TDI and TDO is shifted.

29.5 Boundary-scan Chain

The Boundary-scan chain has the capability of driving and observing the logic levels on
the digital I/O pins, as well as the boundary between digital and analog logic for analog
circuitry having off-chip connection.

29.5.1 Scanning the Digital Port Pins

Figure 29-3 on page 445

shows the Boundary-scan Cell for a bi-directional port pin. The

pull-up function is disabled during Boundary-scan when the JTAG IC contains EXTEST
or SAMPLE_PRELOAD. The cell consists of a bi-directional pin cell that combines the
three signals Output Control - OCxn, Output Data - ODxn, and Input Data - IDxn, into
only a two-stage Shift Register. The port and pin indexes are not used in the following
description.

The Boundary-scan logic is not included in the figures in the datasheet.

Figure 29-4 on

page 446

shows a simple digital port pin as described in the section

"I/O-Ports" on page

186

. The Boundary-scan details from

Figure 29-3 on page 445

replaces the dashed box

in

Figure 29-4 on page 446

.