Avago Technologies LSI53C1010R User Manual
Page 382

IX-6
Index
Version 2.2
Copyright © 2000–2003 by LSI Logic Corporation. All rights reserved.
capabilities pointer (CP[7:0])
capabilities pointer register
capability ID (CID[7:0])
capability ID register
carry test
chained block moves
chained mode (CHM)
change bus phases
chip
control 0 (CCNTL0)
control 1 (CCNTL1)
test five (CTEST5)
,
test four (CTEST4)
test one (CTEST1)
test six (CTEST6)
test three (CTEST3)
,
test two (CTEST2)
test zero (CTEST0)
CHMOV
class code register
clear DMA FIFO (CLF)
,
clear instruction
clear SCSI FIFO (CSF)
CLK
clock
address incrementor
byte counter
conversion factor
halt SCSI
quadrupler
command register
compare
data
phase
configuration
read command
registers
space
write command
configured
as I/O (CIO)
as memory (CM)
connected (CON)
,
CRC
,
control and generation
control one (CRCCTNL1)
control zero (CRCCNTL0)
data (CRCD)
data register selector
disable checking
disable protocol checking
enable auto seed
error
options
pad byte value
pad byte value (CRCPAD)
request OK
test CRC accumulate
test CRC check
test seed
CRC-32
cumulative SCSI byte count (CSBC)
current
function of input voltage
function of output voltage
cycle frame
cyclic redundancy check
D
D0
D1
D1_Support (D1S)
D2
D2_Support (D2S)
D3
D3cold
D3hot
DACs
data
(DATA[7:0])
compare mask
compare value
parity error reported (DPR)
paths
register
structure address (DSA)
data register
data_scale (DSCL)
data_select (DSLT)
DC characteristics
default download mode
destination
address
I/O-memory enable (DIOM)
detected parity error (from slave) (DPE)
device
select
specific initialization (DSI)
DEVSEL/
timing (DT[1:0])
DIEN
differential mode
DIP
direct