INFICON IC6 Thin Film Deposition Controller - Manual (Page 142)

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IC6 Operating Manual
7.7 TEST Page Set Up
Figure 7-6 General screen test page
TEST . . . . . . . . . . . . . . . . . . . . . . . . On (1), Off (0)
Press the TOGL key to move through the choices. The default is Off. The IC6
contains a software controlled Test Mode which simulates actual operation. The
purpose of the Test Mode is to verify basic operation and for demonstrating
typical operation to the technician. The word TEST will be displayed when Test
Mode is on.
The Rate displayed during Test Mode operation is determined as shown in
equation [1] .
[1]
Relays, inputs, source and recorder outputs operate normally during Test Mode
but Crystal fails are ignored unless Advanced Test is set to On.
TIME COMPRESSED . . . . . . . . . . . Yes (1), No (0)
When in Test Mode, this feature allows a faster than real time execution of the
Process. This is useful when testing a long Process. A value of Yes increases
the speed of execution 10 to 1. The default value is No.
ADVANCED TEST . . . . . . . . . . . . . . On (1), Off (0)
If set to On, the IC6 will respond to crystal fails and switch to backup sensors
or crystal positions. A TEST will be displayed when the Advanced Test is On.
The default value is Off.
Displayed Rate
40
DENSITY (gm/cc)
----------------------------------------------- TOOLING (%)
100%
--------------------------------------- 
·
Å/sec =