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Avago Technologies LSI53C896 User Manual

Page 274

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6-6

Specifications

Version 3.3

Copyright © 1998–2003 by LSI Logic Corporation. All rights reserved.

Table 6.9

Bidirectional Signals – AD[63:0], C_BE[7:0]/, FRAME/, IRDY/, TRDY/,
DEVSEL/, STOP/, PERR/, PAR, PAR64, REQ64/, ACK64/

Symbol

Parameter

Min

Max

Unit

Test Conditions

V

IH

Input high voltage

0.5 V

DD

5.0

V

V

IL

Input low voltage

V

SS

-0.3

0.3 V

DD

V

V

OH

Output high voltage

0.9 V

DD

V

500

µ

A

V

OL

Output low voltage

0.1 V

DD

V

1500

µ

A

V

OH

5 V Tolerant output high voltage

2.4

V

16 mA

V

OL

5 V Tolerant output low voltage

0.55

V

16 mA

I

OZ

3-state leakage

10

10

µ

A

V

PIN

= 0 V, 5.25 V

I

PULL-DOWN

Pull down current

1

7.5

75

µ

A

1. Pull-down test does not apply to AD[31:0] and C_BE[3:0]/.

Table 6.10

Input Signals – CLK, GNT/, IDSEL, INT_DIR, RST/, SCLK, TCK, TDI,
TEST_HSC

1

, TEST_RST/, TMS

1. TEST_HSC has a pull-down.

Symbol

Parameter

Min

Max

Unit

Test Conditions

V

IH

Input high voltage

0.5 V

DD

5.0

V

V

IL

Input low voltage

V

SS

-0.3

0.3 V

DD

V

I

IN

Input leakage

2

2. The Input leakage test does not apply to the TEST_RST/ pin with V

PIN

= 0 V.

10

10

µ

A

V

PIN

= 0 V, 5.25 V

I

PULL-UP

3

3. Pull-up spec does not apply to: SCLK, CLK, GNT/, IDSEL, and RST/.

Pull up current

75

7.5

µ

A