Freescale Semiconductor MPC5200B - Manual (Page 19)

Table Of Contents
Paragraph Page
Number Number
MPC5200B Users Guide, Rev. 1
TOC-18 Freescale Semiconductor
20.8.8.1 Transmitting Or Receiving A Block Mode Message ...............................................................................20-45
20.8.8.2 Transmitting Or Receiving A Message In 4X Mode ................................................................................20-46
20.8.9 BDLC Module Initialization ..........................................................................................................................20-47
20.8.9.1 Initialization Sequence .............................................................................................................................20-47
20.8.9.2 Initializing the Configuration Bits ............................................................................................................20-48
20.8.9.3 Exiting Loopback Mode and Enabling the BDLC module ......................................................................20-48
20.8.9.4 Enabling BDLC Interrupts ........................................................................................................................20-48
20.9 Resets .....................................................................................................................................................................20-50
20.9.1 General ............................................................................................................................................................20-50
Chapter 21 Debug Support and JTAG Interface
21.1 Overview .................................................................................................................................................................21-1
21.2 TAP Link Module (TLM) and Slave TAP Implementation ....................................................................................21-1
21.3 TLM and TAP Signal Descriptions .........................................................................................................................21-4
21.3.1 Test Reset (TRST) ............................................................................................................................................21-4
21.3.2 Test Clock (TCK) .............................................................................................................................................21-4
21.3.3 Test Mode Select (TMS) ..................................................................................................................................21-4
21.3.4 Test Data In (TDI) ............................................................................................................................................21-4
21.3.5 Test Data Out (TDO) ........................................................................................................................................21-5
21.4 Slave Test Reset (STRST) ......................................................................................................................................21-5
21.4.1 Enable Slave—ENA[0:n] ................................................................................................................................21-5
21.4.2 Select DR Link—SEL[0:n] .............................................................................................................................21-5
21.4.3 Slave Test Data Out—STDO[0:n] ..................................................................................................................21-5
21.5 TAP State Machines ................................................................................................................................................21-5
21.6 G2_LE Core JTAG/COP Serial Interface ...............................................................................................................21-6
21.7 TLM Link DR Instructions ......................................................................................................................................21-7
21.7.1 TLM:TLMENA ................................................................................................................................................21-8
21.7.2 TLM:PPCENA .................................................................................................................................................21-8
21.8 TLM Test Instructions .............................................................................................................................................21-8
21.8.1 IDCODE ...........................................................................................................................................................21-8
21.8.1.1 Device ID Register .....................................................................................................................................21-8
21.8.2 BYPASS ...........................................................................................................................................................21-8
21.8.3 SAMPLE/PRELOAD .......................................................................................................................................21-8
21.8.4 EXTEST ............................................................................................................................................................21-9
21.8.5 CLAMP .............................................................................................................................................................21-9
21.8.6 HIGHZ ..............................................................................................................................................................21-9
21.9 G2_LE COP/BDM Interface ..................................................................................................................................21-9
Appendix A Acronyms and Terms
Appendix B List of Registers