Rockwell Automation 5370-CVIM2 Module User Manual

Page 192

Chapter

Chapter 6

Reference Tools

6–33

NOTE: The

EE:

and/or

MC:

devices may be useful for saving subimages

while testing reference window tools. However, when testing is completed,
transferring those subimages to the

V1:

V2:

devices will release space in

the

EE:

device, or allow removal of the

MC:

device.

Search Window Configuration

The next step in the configuration process is to “pick and place” the search
window over the appropriate portion of the image field. This is the area in
which the feature window will search for the feature image during setup and
online operations. Generally, the window should be only as large as
necessary to include the anticipated workpiece position changes within the
image field, since the larger the search window, the longer the search time.

To activate the search window’s pick and place function, pick the
button. Then, position the search window over the appropriate search area in
the workpiece image and set the window’s size, as illustrated by the example
in Figure 6.28. Pick the

button in the

Pick & Place

panel to exit back

to the tool edit panel.

Figure 6.28

Example: Positioning the Search Window in Image Field

Search window