MTS Series 793 Application - Manual (Page 301)

High Speed Timed Acquisition Process
MTS MultiPurpose TestWare® Data Acquisition Process Descriptions 301
High Speed Timed Acquisition Process
About the High Speed Timed Acquisition Process
The High Speed Timed Acquisition process records short bursts of conditioned
sensor data. This process is typically used in tests where it is triggered and then
quickly interrupted by other processes, so that it is only active for short periods of
time.
Note Unlike other data acquisition processes, this process is not designed to
acquire data for the duration of a test, or for even long periods of time
within a test.
Sensor signals
Sensors signals for this process are only available from the following
conditioners: Models 493.21B and 493.25 conditioners and Models 494.25,
494.26, and 494.16 conditioners whose HWI settings are configured for high-
speed data.
Important When designing a test procedure, do not try to collect data on the
same signal with more than one High Speed Data Acquisition
process. Concurrent High Speed Data Acquisition processes which
collect data on the same signal will not operate properly.
Sample rates
When you define a High Speed Timed Acquisition process, you must define the
time between samples, or the sample rate. This determines how the process
acquires data when it is active.
• You can acquire data at periodic intervals.
• Data is recorded in the units specified by the selected unit assignment set.
• You can specify how many samples are taken, and when the samples are
acquired.
• If a number of samples is not specified, samples are taken as long as the
process is active.
Sample rate and
sampling duration
limitations
The following tables show the relationship between the number of signals you
can select and the maximum potential sample rate at which the process can
acquire data.