Avago Technologies LSI53C876E - Manual (Page 236)

6-4 Electrical Characteristics
Table 6.6 Capacitance
Symbol Parameter Min Max Unit Test Conditions
C
I
Input capacitance of input pads – 7 pF –
C
IO
Input capacitance of I/O pads – 10 pF –
Table 6.7 Output Signals—INTA/, INTB/
Symbol Parameter Min Max Unit Test Conditions
V
OH
Output high voltage 2.4 V
DD
V
−
16 mA
V
OL
Output low voltage V
SS
0.4 V 16 mA
I
OZ
3-state leakage
−
200
−
50
µ
A –
Note: INTA/ and INTB/ have 100
µ
A pull-ups that are enabled when TESTIN is low. INTA/ and
INTB/ can be enabled with a register bit as an open drain output with an internal 100
µ
A
pull-up.
Table 6.8 Output Signals—SDIR[15:0], SDIRP0, SDIRP1, BSYDIR, SELDIR, RSTDIR,
TGS, IGS, MAS/[1:0], MCE/, MOE/_TESTOUT, MWE/
Symbol Parameter Min Max Unit Test Conditions
V
OH
Output high voltage 2.4 V
DD
V
−
4 mA
V
OL
Output low voltage V
SS
0.4 V 4 mA
I
OZ
3-state leakage
−
10 10
µ
A –
Note: Each of these output signals have a 100
µ
A pull-up that is enabled when TESTIN is low.