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3 testability, Testability – Avago Technologies LSI53C876E User Manual

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1-6

General Description

Performs Wide Ultra SCSI synchronous transfers as fast as
40 Mbytes/s.

Supports 536-byte DMA FIFO for more effective PCI and SCSI bus
utilization.

Supports 16 levels of SCSI synchronous offset.

Supports variable block size and scatter/gather data transfers

Minimizes SCSI I/O start latency.

Performs complex bus sequences without interrupts, including
restore data pointers.

Reduces interrupt service routine overhead through a unique
interrupt status reporting method.

Supports Load and Store SCRIPTS instructions to increase the
performance of data transfers to and from chip registers.

Supports target disconnect and later reconnect with no interrupt to
the system processor.

Supports multithreaded I/O algorithms in SCSI SCRIPTS with fast
I/O context switching.

Supports expanded Register Move instructions.

Compatible with LSI53C875 software (drivers and SCRIPTS).

Enables Ultra SCSI with 40 MHz SCSI clock input with integrated
clock doubler.

1.3.3 Testability

The LSI53C876 contains these testability features:

All SCSI signals accessible through programmed I/O.

SCSI loopback diagnostics.

SCSI bus signal continuity checking.

Support for single step mode operation.

Test mode (AND-tree) to check pin continuity to the board.