3 testability, Testability – Avago Technologies LSI53C876E User Manual
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1-6
General Description
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Performs Wide Ultra SCSI synchronous transfers as fast as
40 Mbytes/s.
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Supports 536-byte DMA FIFO for more effective PCI and SCSI bus
utilization.
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Supports 16 levels of SCSI synchronous offset.
•
Supports variable block size and scatter/gather data transfers
•
Minimizes SCSI I/O start latency.
•
Performs complex bus sequences without interrupts, including
restore data pointers.
•
Reduces interrupt service routine overhead through a unique
interrupt status reporting method.
•
Supports Load and Store SCRIPTS instructions to increase the
performance of data transfers to and from chip registers.
•
Supports target disconnect and later reconnect with no interrupt to
the system processor.
•
Supports multithreaded I/O algorithms in SCSI SCRIPTS with fast
I/O context switching.
•
Supports expanded Register Move instructions.
•
Compatible with LSI53C875 software (drivers and SCRIPTS).
•
Enables Ultra SCSI with 40 MHz SCSI clock input with integrated
clock doubler.
1.3.3 Testability
The LSI53C876 contains these testability features:
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All SCSI signals accessible through programmed I/O.
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SCSI loopback diagnostics.
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SCSI bus signal continuity checking.
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Support for single step mode operation.
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Test mode (AND-tree) to check pin continuity to the board.