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Edo dram random access cycle (basic cycle), Edo dram page access cycle – Epson S1C33210 User Manual

Page 96

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8 ELECTRICAL CHARACTERISTICS

A-82

EPSON

S1C33210 PRODUCT PART

EDO DRAM random access cycle (basic cycle)

BCLK

A[23:0]

#RAS

#HCAS/
#LCAS

#RD

D[15:0]

#WE

D[15:0]

RAS1

Data transfer #1

Next data transfer

CAS1

PRE1

(precharge)

RAS1'

CAS1'

t

AD

t

AD

t

AD

t

CASD2

t

CASD1

t

RDS2

t

ACCE

t

RACE

t

RDH

t

RASD2

t

RASD1

t

RASW

t

RDD3

t

RDD1

t

RDW2

t

WRD3

t

WRD1

t

WRW2

;;;;;;;;;

;;;;;;;;;

;;;;;;;;;;

;;;;;;;;;;

;;;

;;;

t

WDD1

t

WDD2

;;;;;

;;;;;

t

CASW

t

CACE

1

1

t

RDH

is measured with respect to the first signal change (negation) of either the #RD or the #RASx signals.

EDO DRAM page access cycle

BCLK

A[23:0]

#RAS

#HCAS/
#LCAS

#RD

D[15:0]

#WE

D[15:0]

RAS1

Data transfer #1

Data transfer #2

Next data transfer

CAS1

CAS2

PRE1

(precharge)

RAS1'

t

AD

t

AD

t

AD

t

RDS

t

ACCE

t

RACE

t

RASD2

t

RASD1

t

RDD3

t

RDD1

t

WRD3

t

WRD1

;;;;;;;;;

;;;;;;;;;

;;;;;;;;;;;;;;

;;;;;;;;;;;;;;

;;;;;

;;;;;

;;;;

;;;;

t

WDD1

t

WDD2

t

WDD2

;;;;;

;;;;;

t

CACE

t

ACCE

t

RASW

t

RDW2

t

CASD2

t

CASD1

;;;;

;;;;

t

CASW

t

WRW2

t

RDH

t

RDS

t

RDH

1

1

t

RDH

is measured with respect to the first signal change from among the #RD (negation), #RASx (negation)

and #CAS (fall) signals.