Edo dram random access cycle (basic cycle), Edo dram page access cycle – Epson S1C33210 User Manual
Page 96
8 ELECTRICAL CHARACTERISTICS
A-82
EPSON
S1C33210 PRODUCT PART
EDO DRAM random access cycle (basic cycle)
BCLK
A[23:0]
#RAS
#HCAS/
#LCAS
#RD
D[15:0]
#WE
D[15:0]
RAS1
Data transfer #1
Next data transfer
CAS1
PRE1
(precharge)
RAS1'
CAS1'
t
AD
t
AD
t
AD
t
CASD2
t
CASD1
t
RDS2
t
ACCE
t
RACE
t
RDH
t
RASD2
t
RASD1
t
RASW
t
RDD3
t
RDD1
t
RDW2
t
WRD3
t
WRD1
t
WRW2
;;;;;;;;;
;;;;;;;;;
;;;;;;;;;;
;;;;;;;;;;
;;;
;;;
t
WDD1
t
WDD2
;;;;;
;;;;;
t
CASW
t
CACE
∗
1
∗
1
t
RDH
is measured with respect to the first signal change (negation) of either the #RD or the #RASx signals.
EDO DRAM page access cycle
BCLK
A[23:0]
#RAS
#HCAS/
#LCAS
#RD
D[15:0]
#WE
D[15:0]
RAS1
Data transfer #1
Data transfer #2
Next data transfer
CAS1
CAS2
PRE1
(precharge)
RAS1'
t
AD
t
AD
t
AD
t
RDS
t
ACCE
t
RACE
t
RASD2
t
RASD1
t
RDD3
t
RDD1
t
WRD3
t
WRD1
;;;;;;;;;
;;;;;;;;;
;;;;;;;;;;;;;;
;;;;;;;;;;;;;;
;;;;;
;;;;;
;;;;
;;;;
t
WDD1
t
WDD2
t
WDD2
;;;;;
;;;;;
t
CACE
t
ACCE
t
RASW
t
RDW2
t
CASD2
t
CASD1
;;;;
;;;;
t
CASW
t
WRW2
t
RDH
t
RDS
t
RDH
∗
1
∗
1
t
RDH
is measured with respect to the first signal change from among the #RD (negation), #RASx (negation)
and #CAS (fall) signals.