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Typical test cases – EXFO IQS-8100 Series Transport Blazer for IQS-600 User Manual

Page 79

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Creating and Starting a Test Case

SONET/SDH Application

65

Typical Test Cases

Typical Test Cases

The remaining of this chapter describes how to create the following typical
DSn/PDH, SONET/SDH, OTN, Next Generation, and Ethernet over OTN test
cases. The availability of test cases depend on the module and activated
options.

³

Creating an Electrical DSn/PDH Test Case in Normal Mode
(IQS-8105/15/20/30)
on page 66

³

Creating an Electrical DS1 or DS3 Test Case in Dual RX Mode
(IQS-8105/15/20/30)
on page 71

³

Creating an Electrical DS1 Test Case in NI/CSU Emulation Mode
(IQS-8105/15/20/30)
on page 75

³

Creating an Electrical SONET/SDH Test Case on page 79

³

Creating an Optical SONET/SDH Test Case (IQS-8115/20/30) on page 83

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Creating an Optical SONET/SDH Test Case on an IQS-8140 on page 87

³

Creating an Optical SONET/SDH/OTN Multi-Channel SDT Test Case
(IQS-8120/8130/8140)
on page 91

³

Creating an OTN (OTU1 and OTU2) Test Case on page 92

³

Creating an OTN (OTU3) Test Case on page 97

³

Creating a Next Generation Test Case including VCAT/LCAS and GFP on
page 103

³

Creating an OTN Overclocked (OTU1e/OTU2e/OTU1f/OTU2f) Test Case
(IQS-8130, IQS-8130NG, and IQS-8130NGE)
on page 108.