EXFO IQS-8100 Series Transport Blazer for IQS-600 - Manual (Page 117)

Creating and Starting a Test Case
SONET/SDH Application 103
Typical Test Cases
Creating a Next Generation Test Case including
VCAT/LCAS and GFP
The following procedure describes a Next Generation test case, including
VCAT/LCAS and GFP.
To create a Next Generation Test Case on an IQS-8120NG,
IQS-8120NGE, IQS-8130NG, or IQS-8130NGE module:
1. Test configuration:
1a. Select the source Clock Mode that will be used
for the test. Refer to Clock Configuration on
page 129 for more information.
1b. Select Normal as the Test Mode. Refer to Test
Configuration on page 126 for more information.
1c. Leave the Coupled check box selected.
1d. Select the Through check box to loop the RX
signal to the TX port. The Clock Mode is automatically set to
Recovered when the Through check box is selected.
1e. Select the SONET/SDH Intrusive check box to loop the RX signal
to the TX port with TX overwrite capabilities. Available when the
Coupled check box is selected.
1f. Leave the OTN Intrusive check box cleared.
1g. Press Next.
2. Interface connector selection:
2a. From the data path
selector, press the
Optical interface connector. Optical is automatically selected
when SONET/SDH Intrusive check box is selected.
2b. For OC-192/STM-64 leave the Framing selection
to Framed.