Fluke Biomedical 601PRO XL - Manual (Page 124)

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AAMI Controlled Power Sequence and Limits
AAMI STANDARD TESTS DUT OUTLET IEC 601 CLASS/TYPE & AAMI CATEGORY*
l/B I/BF I/CF II/B
DESCRIPTION POLARITY CIRCUIT NON-ISOLATE LIKELY
CONTACT
ISOLATE NO CONTACT
Line Voltage V N/A OFF NL NL NL NL
Ground Wire
Ω
**
N/A OFF 0.2 0.2 0.2 NT
Startup Delay (auto only) Norm Norm
L2 Current A Norm Norm NL NL NL NL
Enclosure µA Norm Norm 100 100 1003 100
AP – Gnd µA Norm Norm 10 NT 10 NT
Interlead µA Norm Norm 10 NT 10 NT
AP sink µA *** Norm Norm NT NT 50 NT
Earth µA Norm No E 500 500 500 500
Enclosure µA Norm No E 300 300 300 500
AP – Gnd µA Norm No E 100 NT 50 NT
Interlead µA Norm No E 100 NT 50 NT
Power OFF Delay Norm No L2
No E
Earth µA Norm No L2
No E 1000 1000 1000 1000
Startup Delay (auto only) Reverse Norm
Enclosure µA Reverse Norm 100 100 100 100
AP – Gnd µA Reverse Norm 10 NT 10 NT
Interlead µA Reverse Norm 10 NT 10 NT
Earth µA Reverse No E 500 500 500 500
Enclosure µA Reverse No E 300 300 300 500
AP – Gnd µA Reverse No E 100 NT 50 NT
Interlead µA Reverse No E 100 NT 50 NT
Power OFF Delay Reverse No L2
No E
Earth µA Reverse No L2
No E 1000 1000 1000 1000
*In the AAMI Test Standard, the IEC 601 Class and Type designations have no meaning other than to select the AAMI
Category as shown in the table. The AAMI test limits in this table are for General Cord Connected Equipment Only.
**Not specified by AAMI/ANSI – The limit shown for IEC 601-1 for Protective Earth Resistance is dependent upon the device
under
test: 0.2
Ω
for devices with a non-detachable power supply cord; 0.1
Ω
for devices with an appliance inlet.
***Mains on AP – Is performed with NORMAL OUTLET polarity and both Normal and Reversed phase of the isolated mains. The test is
not done in the single fault condition as required by AAMI/ANSI, nor is there a 120 K
Ω
resistance in series with the isolated source.
In the AAMI Test Standard, it is possible to get an Inv limit in the Interlead tests if using multiple type lead definitions.
If this occurs, check the definition of the leads in the Device Information Record.