Adept AdeptSight User Guide - Manual (Page 515)

Configuring Pattern Locator Properties - Advanced
The Advanced Properties section of the Pattern Locator interface provides access to advanced
Pattern Locator parameters and properties.
Tool Sampling Parameters
Sampling refers to the procedure used by the tool for gathering values within the portion of
the input image that is bounded by the tool region of interest. Two sampling parameters, the
Sampling Step and Bilinear Interpolation, can be used to create the desired balance between
speed and accuracy.
Bilinear Interpolation
Bilinear Interpolation uses pixel averaging to improve the quality of the image. It is applied
before the image is analyzed.
To ensure subpixel accuracy in inspection applications, Bilinear Interpolation should always
be set to True (enabled). Non-interpolated sampling (Bilinear Interpolation disabled) should
only be used in applications where the speed requirements are more critical than accuracy.
Custom Sampling Step (1 - 100)
The Sampling Step is the step used by the tool to sample the area of the input image that is
bounded by the tool region of interest. The sampling step represents the height and the
width of a sampled pixel.
For applications where a more specific tradeoff between speed and accuracy must be estab-
lished, the sampling step can be modified by enabling the Custom Sampling Step and setting
the desired value.
Object Definition
Default Default is the best sampling step computed by the
tool. It is based on the average size, in calibrated
units, of a pixel in the image. This default sam-
pling step is usually recommended. Default is auto-
matically used by the tool if no other value is
specified.
Configuring Pattern Locator Properties - Advanced
AdeptSight User's Guide, Version 3.2.x, Updated: 8/23/2012
Page 515