Avago Technologies LSI20160 - Manual (Page 98)

4-30 Windows NT 4.0 Device Driver Installation
Copyright © 1993–2001 by LSI Logic Corporation. All rights reserved.
Table 4.5 lists the fields within the Adjustments box along with their
descriptions.
The Test Procedures box contains the test sequences, which can be
executed on the selected device. Double click on the sequence name to
execute.
Note: During test executions, the adapter channel on which the
specified device resides is blocked from all other activity.
For the LSI53C1000 or LSI53C1010 based host adapter
card(s), the second channel is also blocked during
execution of the Stress Pattern I/O test if the LVD Driver
Signal or the Req/Ack Skew values are anything except
Nominal. This could have a negative impact in the
performance and/or stability of the system under high
loads.
Table 4.5 Adjustments Fields and Descriptions
Field Description
Sync Speed Indicates starting synchronous value to be used by the
miniport driver when negotiating with the drive to test.
Bus Width Indicates starting bus width value, in bits, to be used by the
miniport driver when negotiating with the drive to test.
LVD Driver Signal Indicates the LVD Driver Signal strength requested for this
test run. A value other than Nominal will adjust this signal
in order to run the requested test at a slightly altered LVD
signal level. Only applicable during the Stress Pattern IO
test.
Req/Ack Skew Indicates the Req/Ack Skew value requested for this test
run. A value other than Nominal will adjust this timing in
order to run the requested test with a slightly altered bus
timing environment. Only applicable during the Stress
Pattern IO test.
Data Pattern Allows you to select one of three data patterns to be used
for the Write/Read buffers test.