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5 reliability, 6 testability, Reliability – Avago Technologies LSI53C1030 User Manual

Page 29: Testability

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Summary of LSI53C1030 Features

1-13

Version 2.2

Copyright © 2001, 2002, 2003 by LSI Logic Corporation. All rights reserved.

1.8.5 Reliability

These features enhance the reliability of the LSI53C1030:

Supports intersymbol interference (ISI) compensation

Provides 2 kV ESD protection on SCSI signals

Provides latch-up protection greater than 150 mA

Provides voltage feed-through protection

Supports LSI Logic Integrated RAID (IR) solution to provide physical
mirroring or striping of the boot volume

Has a high proportion of power and ground pins

Provides power and ground isolation of I/O pads and internal chip
logic

Supports CRC checking and generation in Double Transition (DT)
phases

Provides comprehensive SureLINK Domain Validation technology:

Basic (Level 1) with inquiry command

Enhanced (Level 2) with read/write buffer

Margined (Level 3) with margining of drive strength and slew
rates

Supports TolerANT technology, which provides:

Active negation of SCSI Data, Parity, Request, and Acknowledge
signals for improved SCSI transfer rates

Input signal filtering on SCSI receivers for improved data
integrity, even in noisy cabling environments

1.8.6 Testability

These features enhance the testability of the LSI53C1030:

Allows all SCSI signals to be accessed through programmed I/O

Supports JTAG boundary scan

Provides ARM Multi-ICE

®

for debugging purposes