Teledyne LeCroy Serial Data Debug Solutions - Manual (Page 135)

Operator's Manual
919586 RevA 135
Setup Acquisition
The Setup Acquisition button automatically makes the following settings. The settings are largely based on your
LP (Low Power) or HS (High Speed) mode selection on the Mode and Input Selection Area of the MIPI D-PHY
Dialog (below).
S ETUP A CQUISITION FOR LP L OW P OWER M ODE
Your channels are set to 200 mV/div, -600 mV offset, and a Qualified-Pattern trigger is applied to the signal for
capturing the ULPS sequence.
S ETUP A CQUISITION FOR HS H IGH S PEED M ODE
Your channels are set to 200 mV/div, -600 mV offset, and an Edge trigger is applied to the signal.
M ODE AND I NPUT S ELECTION A REA OF THE MIPI D-PHY D IALOG
As previously mentioned in the MIPI D-PHY Dialog Details (on page 133) topic, the Mode selection affects the
settings the Setup Acquisition button has based on the LP (Low Power) or HS (High Speed) choices.
The selection also controls which tests are presented on the Test Parameter Switchboard and corresponding
Test Dialogs.
Dp, Dn, CLKp, and CLKn Controls
The remaining fields on this section of the MIPI D-PHY Dialog include controls for Dp (Data Positive), Dn (Data
Negative), CLKp (Clock Positive), and CLKn (Clock Negative).
When these fields are selected, a pop-up is shown where you can select your input source for each of the four
required signals.
T EST P ARAMETER S UMMARY A REA
The Test Parameter Summary area is a section of the MIPI D-PHY dialog showing all the available tests for HS
and LP Modes.
Enabling Tests
Enable/disable a test by either marking/unmarking its respective checkbox from the summary area...