6 testability, Testability – Avago Technologies LSI53C1020 User Manual
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1-12
Introduction
Version 2.4
Copyright © 2001–2004 by LSI Logic Corporation. All rights reserved.
•
Provides 2 kV electrostatic discharge (ESD) protection on SCSI
signals
•
Provides latch-up protection greater than 150 mA
•
Provides voltage feed-through protection
•
Supports the Integrated RAID (IR) solution to provide physical
mirroring or striping of the boot volume
•
Has a high proportion of power and ground pins
•
Provides power and ground isolation of I/O pads and internal chip
logic
•
Supports CRC checking and generation in double transition (DT)
phases
•
Provides comprehensive SureLINK Domain Validation technology:
–
Basic (Level 1) with inquiry command
–
Enhanced (Level 2) with read/write buffer
–
Margined (Level 3) with margining of drive strength and slew
rates
•
Supports TolerANT technology, which provides:
–
Active negation of SCSI Data, Parity, Request, and Acknowledge
signals for improved SCSI transfer rates
–
Input signal filtering on SCSI receivers for improved data
integrity, even in noisy cabling environments
1.8.6
Testability
These features enhance the testability of the LSI53C1020:
•
Allows all SCSI signals to be accessed through programmed I/O
•
Supports JTAG boundary scan
•
Provides ARM Multi-ICE
®
test interface for debugging purposes