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Table 7-15, Memory (ddr) interface signals – AMD Geode LX [email protected] User Manual

Page 614

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614

AMD Geode™ LX Processors Data Book

Electrical Specifications

33234H

Table 7-15. Memory (DDR) Interface Signals

Symbol
(Note 1)

Parameter

Min

Max

Unit

Comments

t

CK

SDCLK[5:0]P, SDCLK[5:0]N period

5.0

ns

Note 2

t

CH

SDCLK[5:0]P, SDCLK[5:0]N High time

2.4

ns

48% t

CK

t

CL

SDCLK[5:0]P, SDCLK[5:0]N Low time

2.4

ns

48% t

CK

t

SKEW1

SDCLK[n]P to SDCLK[n]N skew (n=0..5)

0.1

ns

Guaranteed by
design

t

DEL1

SDCLK[5:1]P, SDCLK[5:0]N edge delay from
SDCLK[0]P

-0.2

0.2

ns

Note 2, Note 3

DQS[7:0] Input and output period

5.0

ns

Same as t

CK

t

DQSCK

DQS[7:0] Input delay relative to SDCLK[5:0]

-0.5

t

CK

-2 ns

Note

4

t

DEL2

DQS[7:0] output edge delay from SDCLK[5:0]

-0.5

0.5

ns

Note 3

t

RPRE

DQS input preamble before first DQS rising edge

0.25*t

CK

ns

Note 3

t

RPST

DQS input postamble after last DQS rising edge

0.25*t

CK

Note 3

t

WPRE

DQS output write preamble valid time before
SDCLK[5:0] rising edge

0.5*t

CK

-0.4

0.5*t

CK

+1

ns

t

WPST

DQS output write postamble after last DQS falling
edge

0.75*t

CK

-0.4

0.75*t

CK

+1

ns

t

DQSQs

DQ[63:0] Input setup time from DQS

-0.25*t

CK

+0.5

ns

Note 3,Note 5

t

DQSQh

DQ[63:0] Input hold time from DQS

0.25*t

CK

+0.5

ns

Note 3, Note 5

t

VAL1

DQ[63:0], DQM[7:0] Output Data Valid Delay time
from DQS rising OR falling edge

0.25*t

CK

-0.4

0.25*t

CK

+0.4

ns

Note 3,

t

VAL2

MA[12:0], BA[1:0], CAS[1:0]#, RAS[1:0]#,
CKE[1:0], CS[3:0]#, WE[1:0] Output Valid Delay
time from SDCLK[5:0]

1.1

3.0

ns

Note 3, Note 4

Note 1. Refer to Figure 7-8 "DDR Write Timing Measurement Points" on page 615 and Figure 7-9 "DDR Read Timing Mea-

surement Points" on page 616.

Note 2. The SDCLKP and SDCLKN clocks are inversions of each other (differential clocking).
Note 3. These parameters guarantee device timing, but they may be tested to a looser value to allow for tester uncertain-

ties. Devices that meet the loosened tester values meet specs when correlated with lab measurements.

Note 4. t

VAL2

and t

DQSCK

timings are achieved for different DIMM loadings by proper initial settings of the

GLCP_DELAY_CONTROLS MSR. Typical tester results with clock and address loaded equally and no pro-
grammed delay for address are 0 ns for t

VAL2

.

Note 5. The DQ timing relative to DQS are on a per-byte basis only. DQ[7:0] and DQM[0] should be measured against

DQS[0], DQ[15:8] and DQM[1] should be measured against DQS[1], etc.

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