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AMETEK i Series User Manual

Page 268

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User Manual

254

i Series / iX Series

9.8.2.3 Specific Test Limitations and Discrepancies

While every effort has been made to provide comprehensive coverage of the Mil-Std 704 tests,
some limitations apply, largely due to hardware limitations of the iX power source. The following
table lists specific implementation issues by test number. The deviation from the standard
requirement is shown in the “Actual setting” column. The reason for the deviation is shown in the
last column.

Rev

Test

Std requirement

Actual setting

Reason

A

SAC104

.5Vp-v modulation (.3536V RMS)

.4V RMS modulation

Resolution

A

SAC104

3.5Vp-v modulation (2.475V RMS)

2.4V RMS modulation

Resolution

A

TAC104

.5Vp-v modulation (.3536V RMS)

.4V RMS modulation

Resolution

A

TAC104

3.5Vp-v modulation (2.475V RMS)

2.4V RMS modulation

Resolution

A-F

SAC106

50kHz

Test skipped

Requires additional equipment

A-F

TAC106

50kHz

Test skipped

Requires additional equipment

A-F

LDC103

50kHz

Test skipped

Requires additional equipment

A-F

LDC104

16.8kHz

Test skipped

Requires additional equipment

B-F

SAC104

.375V RMS modulation

.4V RMS modulation

Resolution

B-F

SAC104

2.5V RMS modulation

2.4V RMS modulation

Resolution

B-F

TAC104

.375V RMS modulation

.4V RMS modulation

Resolution

B-F

TAC104

2.5V RMS modulation

2.4V RMS modulation

Resolution

B-F

HDC103

50kHz

Test skipped

Requires additional equipment

B-F

HDC104

16.8kHz

Test skipped

Requires additional equipment

F

SVF104

.375V RMS modulation

.4V RMS modulation

Resolution

F

SVF104

2.5V RMS modulation

2.4V RMS modulation

Resolution

F

SVF106

50kHz

Test skipped

Requires additional equipment

F

TVF104

.375V RMS modulation

.4V RMS modulation

Resolution

F

TVF104

2.5V RMS modulation

2.4V RMS modulation

Resolution

F

TVF106

50kHz

Test skipped

Requires additional equipment

F

SXF104

.375V RMS modulation

.4V RMS modulation

Resolution

F

SXF104

2.5V RMS modulation

2.4V RMS modulation

Resolution

F

SXF106

50kHz

Test skipped

Requires additional equipment

F

SXF109

Dwell time = 1 cycle (16.666667 msec) Dwell time = 17msec

Resolution

F

SXF201

Dwell time = 1 cycle (16.666667 msec) Dwell time = 17msec

Resolution

F

SXF302

Dwell time = 1 cycle (16.666667 msec) Dwell time = 17msec

Resolution

F

HDC105

1

330VDC

300VDC limit (test written but will not run) Hardware limit DC range i/iX

F

HDC302

3

350VDC

300VDC limit (test written but will not run) Hardware limit DC range i/iX

B, C HDC105

475VDC

300VDC limit (test written but will not run) Hardware limit DC range i/iX

B, C HDC302

475VDC

300VDC limit (test written but will not run) Hardware limit DC range i/iX

B, C SAC105

+/-1.75Hz modulation

+/-2Hz modulation

Resolution

B, C SAC105

+/-0.85Hz modulation

+/-0.9Hz modulation

Resolution

B, C SAC105

+/-0.58Hz modulation

+/-0.6Hz modulation

Resolution

B, C TAC105

+/-1.75Hz modulation

+/-2Hz modulation

Resolution

B, C TAC105

+/-0.85Hz modulation

+/-0.9Hz modulation

Resolution

B, C TAC105

+/-0.58Hz modulation

+/-0.6Hz modulation

Resolution

1

Note: To perform MIL-STD-704F tests HDC105-1, -3 and HDC302-1, -3, it is advised to use the firmware revision

E tests TRANSIENT and ABNORMAL respectively. The

–704 firmware implementation overrides the DC voltage

range hardware limit making it possible for these tests to be performed. See section 9.8.1.8. The same does not
apply to the equivalent rev B or rev C tests, which require 475VDC. The 475 VDC level is not supported on the i/iX
Series.

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