AMETEK i Series - Manual (Page 196)

User Manual
182 i Series / iX Series
9.2.5.1 DIPS AND INTERRUPTIONS TEST
Scroll to the DIPS AND INTERRUPTIONS entry using the up and down cursor keys. Press the
ENTER key to select the DIPS AND INTERRUPTIONS menu. The screen will appear as shown
in Figure 9-19.
Figure 9-19: IEC Dips and Interrupts
STATE
This field enables or disables the -411 test mode. If an EOS option is present, it will be engaged
when the STATE is toggled on. This field may also be used to reset a fault condition occurring
on the EOS option due to a temperature or over current fault.
EOS STATE
This field can have one of three values:
N/A Indicates no EOS option is present or the EOS option was not powered up when
the STATE was enabled.
ACTIVE The EOS option is active. When active, the –411 firmware will use the EOS for
voltage dips at 0, 40 or 70% test levels. If a second generation EOS is used and
the 70/80 Tap selection on the EOS is set to 80%, you must still program 70 as
the DIP TO level to activate the 80% tap as the firmware only has one control
code for this tap. Thus, the 70% programmed level will activate the 70/80 tap.
The actual level will be determined by the setting of the EOS in this case.
OFF The EOS option is in Bypass mode.