AMETEK i Series - Manual (Page 176)

User Manual
162 i Series / iX Series
Control / Display Description
function is required to implement complex transients that require
multiple steps with zero time skew. When set to a value other
than blank or “0”, subsequent rows are considered part of the
same test step for single step or loop on step execution modes.
PhsB Phase angle of phase B, only visible if phase angle is changed.
PhsC Phase angle of phase C, only visible if phase angle is changed.
Comment A comment about the specific test step.
9.1.2.10 DC Ripple Test Window - Section 16.6.1.2
DC ripple tests f or 28VDC or 14VDC EUT‟s are provided through a separate control screen. This
is required to extend the range of the ripple frequency to 5000 Hz. The actual requirement for
DO160 Rev E is testing up to 150 KHz ripple. This is out of the available range of the iX Series
power source. To test to the full 150 KHz range, an external audio generator and coupling
transformer as outlined in RTCA/DO160, Section 18, Figure 18-1 is required.
The DO160 DC Ripple test screen is available from the main screen, Applications,
RTCA/DO160, DC Ripple Test menu. Once selected, the DC ripple test control screen is modal
and must be closed before any other tests can be run. Opening this screens requires several
seconds as the power source is being set up to perform the DC ripple tests. This screen also
places the power source in AC+DC mode.
Available test settings are 14VDC or 28VDC nominal, category A,Z or category B and
phase/output selection. For single-phase iX systems, only phase A can be selected. The test
pattern is fixed per section 18.3.1 with a ripple frequency range from 16 Hz to 5000 Hz per Figure
18-2 (Cat A,Z) or 18-3 (Cat B). The frequency slew rate is 30 minutes for each decade covered
or one hour and 15 minutes total. Tests can be aborted sooner if needed.
Figure 9-15: DO160E DC Ripple Test Window.