Echelon Series 6000 Chip databook - Manual (Page 97)

EQUIPMENT
UNDER
TEST (EUT)
HP8656B
SIGNAL
GENERATOR
75W
POWER
AMP
GROUND PLANE
TEST
CONTROL
COMPUTER
FCC
CDN - M3
50
Ω
AUXILIARY
EQUIPMENT
(AE)
Dressler
Alpha 250 / 75W
-6dB
75W
PAD
EMCO
ATT 6 / 75
FCC
CDN - M3
EUT
POWER
AE
POWER
GPIB
50
Ω
FCC BCI - Fischer Custom Communications
Bulk Current Injection Probe P/N F-120-9A
FCC CDN M3 - Fischer Custom Communications
Coupling De-Coupling Network P/N FCC-801-M3-16A
STP
FCC
BCI
Termination
Figure 34. Typical EN 61000-4-6 Test Setup for Shielded Twisted-Pair (STP) Wires
Surge and Burst
For the purposes of EMC testing, a surge is a transient overvoltage of several kV with a rise
time that is measured in microseconds or nanoseconds, and with a duration that is measured
in microseconds. Compared with fast transient bursts and ESD, surges are relatively slow,
but also long lived.
A surge is created by a switching event or insulation fault in the AC power distribution
network, or by the switching of a reactive load (such as an electric motor). A surge can also
be caused by lightning, but EN 61000-4-5 only indirectly addresses the effects of lightning.
EN 61000-4-5 Surge testing is performed on a non-conducting table using specialized surge
generation equipment. The surges are injected directly into the network wiring (in a
common-mode fashion) or into the power supply cable through a coupling circuit. During the
test, the device should continue to operate normally, with occasional packet loss due to the
surges.
There are three levels of network testing that are relevant to Series 6000 devices:
• Level 2 conductively couples a ±1 kV surge into the network
• Level 3 conductively couples a ±2 kV surge into the network
• Level “X” conductively couples a user-defined surge voltage into the network
EN 61000-4-4 Burst testing of the network cable is performed on a non-conducting table,
with 1 meter of the network cable clamped in a high-voltage burst generation apparatus.
The test capacitively injects high voltage bursts of noise into the network cable. The test
injects three bursts onto the network cable each second. During the test, the device should
continue to operate normally, with occasional packet loss due to the bursts.
Series 6000 Chip Data Book 85