Operating conditions – Echelon Series 6000 Chip databook User Manual
Page 44
•
SAMPLE/PRELOAD — samples current values, or preloads known values into the
boundary-scan cells for a follow-on operation
Required by the IEEE 1149.1 standard
•
EXTEST — tests the interconnection between two devices
Required by the IEEE 1149.1 standard
•
HIGHZ — sets all digital outputs of the Series 6000 chip to a disabled (high-
impedance) state
•
IDCODE — returns the Device ID for the chip
The Device ID for an FT 6000 Smart Transceiver is 0x1320062F; the Device ID for a Neuron
6000 Processor is 0x1320162F.
For more information about the JTAG standard, see IEEE Standard Test Access Port and
Boundary-Scan Architecture, IEEE Std 1149.1-1990 (includes IEEE Std 1149.1a-1993) and
Supplement to IEEE Std 1149.1-1990, IEEE Standard Test Access Port and Boundary-Scan
Architecture, IEEE Std 1149.1b-1994. These documents are available from the IEEE:
Operating Conditions
Table 12 describes the standard operating conditions for Series 6000 chips. In the table, all
values apply to both the FT 6000 Smart Transceiver and the Neuron 6000 Processor, except
the value for I
DD3-TX
, which applies to the FT 6000 Smart Transceiver only. For a Neuron
6000 Processor, see the specifications for your specific transceiver for transmit current
consumption.
Table 12. Series 6000 Chip Operating Conditions
Parameter
Minimum
Typical
Maximum
V
DD3
Supply voltage
3.0 V
3.3 V
3.6 V
T
A
Ambient temperature
–40 ºC
+85 ºC
f
XIN
XIN clock frequency
10.0000 MHz
I
DD3-RX
Current consumption in
receive mode for given
system clock rates
5 MHz
10 MHz
20 MHz
40 MHz
80 MHz
9 mA
9 mA
15 mA
23 mA
38 mA
15 mA
15 mA
23 mA
33 mA
52 mA
I
DD3-TX
Current consumption in
transmit mode
I
DD3-RX
+ 15
mA
I
DD3-RX
+ 18 mA
Notes for Table 12:
32
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