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Overview – Echelon Series 6000 Chip databook User Manual

Page 90

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Overview

A product that is designed for electromagnetic compatibility (EMC) must be able to pass

rigorous tests for immunity to external interference and demonstrate low electromagnetic

interference (EMI) emissions. If the product will be sold in the European Union (EU), the

product must demonstrate appropriate EMC levels to pass European Conformité Européene

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(CE) Marking tests. Even if the product will not be sold in the EU, immunity testing helps

you to design a better, more robust product.
Echelon has performed immunity tests for CE Marking on Series 6000 devices, and has also

performed additional tests to ensure immunity and low emissions. Specifically, Echelon has

performed the following immunity tests:

Electrostatic discharge (ESD) testing (both air and contact discharge) for compliance

with Comité Européen de Normalisation

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(CEN), standard EN 61000-4-2

Radiated radio frequency (RF) immunity testing for compliance with CEN standard

EN 61000-4-3

Burst testing for compliance with CEN standard EN 61000-4-4

Surge testing for compliance with CEN standard EN 61000-4-5

Conducted RF Immunity testing for compliance with CEN standard EN 61000-4-6

Summary and Testing Results summarizes the results of Echelon’s testing for Series 6000

devices.
You need to perform your own immunity testing for Series 6000 devices that you design and

build.
The test results for each of the CEN standard EN 61000-4-x tests are interpreted within the

scope of the product’s specifications and standard operating conditions. A product’s test

results fall into one of the following categories, which are referred to as “performance

criteria”:

1. Normal product performance within specified limits
2. Temporary degradation or loss of function, or performance, that is self-recoverable
3. Temporary degradation or loss of function, or performance, that requires operator

intervention to reset the system

4. Degradation or loss of function that is not recoverable

For example, within a L

ON

W

ORKS

network, losing one network packet because of an ESD or

surge hit likely meets category 1 because the Series 6000 chip resends network data that is

not acknowledged as received.
For more information about the CEN standard tests and to purchase copies of the standards

documents, go to the Information Handling Services (IHS) Global page:

global.ihs.com

.

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European Conformity

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European Committee for Standardization

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Design and Test for Electromagnetic Compatibility