Echelon Series 6000 Chip databook - Manual (Page 95)

The EN 61000-4-3 RF Susceptibility test is generally performed in an RF-shielded anechoic
chamber with high-power transmitter-driven antennas aimed at the equipment under test
(EUT). During the EN 61000-4-3 RF Susceptibility test, the RF signal generator is set to an
amplitude modulation (AM) depth of 80% at 1 kHz, and the frequency is slowly swept from
30 MHz to 1 GHz. With this condition, there are three levels of testing:
• Level 1 subjects the EUT to a 1 V/m field strength
• Level 2, which represents a moderate electromagnetic radiation environment,
subjects the EUT to a 3 V/m field strength
• Level 3, which represents a severe electromagnetic radiation environment, subjects
the EUT to a 10 V/m field strength
During the EN 61000-4-6 Conducted RF Immunity test, the RF signal generator is set to an
AM depth of 80% at 1 kHz, and the frequency is slowly swept from 150 kHz to 80 MHz. With
this condition, there are three levels of testing:
• Level 1 injects a common-mode voltage on the EUT’s network cable of 1 V
RMS
(5 V
P-P
including the 80% AM)
• Level 2, which represents a light industrial environment, injects a common-mode
voltage on the EUT’s network cable of 3 V
RMS
(15.3 V
P-P
including the 80% AM)
• Level 3, which represents a harsh industrial environment, injects a common-mode
voltage on the EUT’s network cable of 10 V
RMS
(50.9 V
P-P
including the 80% AM)
For twisted-pair networks, the preferred test method is the Current Injection method, also
called the Bulk Current Injection (BCI) method. A current clamp injects common-mode noise
onto the twisted-pair communication cable, and both the auxiliary equipment and the EUT
experience similar common-mode noise at their network connections. Even when this wiring
passes through a coupling-decoupling network, the RF noise that is present during the test
can disrupt wired communication between the auxiliary equipment and an external control
PC. Thus, the auxiliary equipment should provide a visual indication of a pass/fail result
during the test, rather than requiring a wired connection to a computer to monitor the result.
Figure 33 shows a typical setup for EN 61000-4-6 testing of a Series 6000 device with
unshielded twisted-pair (UTP) network wire.
Series 6000 Chip Data Book 83