AMETEK Compact i/iX Series Software Manual - Manual (Page 57)

User Manual - Rev H California Instruments
Avionics Software 57
4.1.1.1 Specific Test Limitations and Discrepancies
While every effort has been made to provide comprehensive coverage of the Boeing 787B3-0147
tests, some limitations apply, largely due to hardware limitations of the MX power source such as
available programming resolution or rounding. The following table lists specific implementation issues
by test number. The deviation from the standard requirement is shown in the “Actual setting” column.
The reason for the deviation is shown in the last column.
Vnom Test Std requirement Actual setting Reason
115VAC 1.5.1 115 +/- .26 V mod 115 +/- .3 V mod Resolution
115VAC 1.5.1 115 +/- 1.77 V mod 115 +/- 1.8 V mod Resolution
115VAC 1.6.2 Audio Frequencies Test Skipped Requires Audio Generator
115VAC 2.2 Voltage Spike Test Skipped Requires additional equipment
115VAC 2.4 450us dropouts 1ms dropouts Resolution
115VAC 4.2.2 885 Hz 885Hz Requires HF option
235VAC 1.5.1 230 +/- .52 V mod 230 +/- .6 V mod Resolution
235VAC 1.5.1 230 +/- 3.54 V mod 230 +/- 3.6 V mod Resolution
235VAC 1.6.2 Audio Frequencies Test Skipped Requires Audio Generator
235VAC 2.2 Voltage Spike Test Skipped Requires additional equipment
235VAC 2.4 450us dropouts 1ms dropouts Resolution
235VAC 4.1 315 V 315 V Requires HV option
235VAC 4.2.2 885 Hz 885Hz Requires HF option
28VDC 5.5.2 Voltage Ripple Tests up to 5kHz only Hardware Limit
28VDC 6.1 350us dropout 1ms dropout Resolution
28VDC 6.2 Voltage Spikes Test Skipped Requires additional equipment
28VDC 6.3 450us dropouts 1ms dropout Resolution
4.1.2 i/iX Series –B787 Option Limitations
The extent of coverage of the –787 option as implemented on the iX Series platform is shown in the
table below. Tests marked with an „x‟ generally require additional hardware to be used. Tests marked
„N/A‟ are not applicable to the corresponding table. Tests marked with a „
 ‟ are covered by the –787
option. Tests marked with a „P‟ require arbitrary waveform capability, which is available on iX models
only. Tests marked with a „C‟ are available on the Compact iX products only. Tests marked with an
“I” are available on the i/iX products only.
No. Description 115
VAC
235
VAC
No. 28 VDC Tests
Description Type
I DC
Type
II DC Type
III DC
Type
IV DC
Type
V DC
Type
VI DC
1.1
Individual Phase
Voltage
 C 5.1-4 DC Voltage    
1.2
Average of Three
Phase Voltages
 C 5.5.2 Voltage Ripple I, P I, P I, P I, P
1.3 Phase Displacement  C 6.1 Voltage Transients    
1.4
Phase Voltage
Unbalance

C 6.2 Voltage Spikes X X X X
1.5 Voltage Modulation  C 6.3
Multiple Stroke Power
Interruptions
   
1.6.1
Total Harmonic
Content
P C, P 7.1-4 Abnormal DC Voltage    
1.6.2
Individual Harmonic
Content
X X 8.1
Abnormal Voltage
Transients
   
1.6.3 DC Content P C, P Supp
Supplementary
Transient Tests
   