Specific test limitations and discrepancies, I/ix series –do160 option limitations – AMETEK Compact i/iX Series Software Manual User Manual
Page 26
User Manual
– Rev H
California Instruments
26
Avionics Software
3.1.1.1
Specific Test Limitations and Discrepancies
While every effort has been made to provide comprehensive coverage of the RTCA/DO-160 tests,
some limitations apply, largely due to hardware limitations of the MX power source such as available
programming resolution or rounding. The following table lists specific implementation issues by test
number. The deviation from the standard requirement
is shown in the “Actual setting” column. The
reason for the deviation is shown in the last column.
Vnom
Test
Std requirement
Actual setting
Reason
115VAC
A(CF):16.5.1.2
115 +/- .18 Vrms
115 +/- .2 Vrms
Resolution
115VAC
A(NF):16.5.1.2
115 +/- .18 Vrms
115 +/- .2 Vrms
Resolution
115VAC
A(WF):16.5.1.2
115 +/- .18 Vrms
115 +/- .2 Vrms
Resolution
115VAC
A(CF):16.5.1.2
115 +/- 1.24 Vrms
115 +/- 1.2 Vrms
Resolution
115VAC
A(NF):16.5.1.2
115 +/- 1.24 Vrms
115 +/- 1.2 Vrms
Resolution
115VAC
A(WF):16.5.1.2
115 +/- 1.24 Vrms
115 +/- 1.2 Vrms
Resolution
230VAC
A(CF):16.5.1.2
230 +/- .36 Vrms
230 +/- .4 Vrms
Resolution
230VAC
A(CF):16.5.1.2
230 +/- 2.48 Vrms
230 +/- 2.5 Vrms
Resolution
115VAC
A(CF):16.5.1.3
400Hz mod by .75Hz 400Hz mod by .8Hz
Resolution
115VAC
A(NF):16.5.1.3
360Hz mod by .75Hz 360Hz mod by .8Hz
Resolution
115VAC
A(NF):16.5.1.3
650Hz mod by .75Hz 650Hz mod by .8Hz
Resolution
115VAC
A(WF):16.5.1.3
360Hz mod by .75Hz 360Hz mod by .8Hz
Resolution
115VAC
A(WF):16.5.1.3
800Hz mod by .75Hz 800Hz mod by .8Hz
Resolution
230VAC
A(CF):16.5.1.3
400Hz mod by .75Hz 400Hz mod by .8Hz
Resolution
14VDC
ADC:16.6.1.1
15.15 V nom
15.2 V nom
Resolution
14VDC
BDC:16.6.1.1
15.15 V nom
15.2 V nom
Resolution
14VDC
ZDC:16.6.1.1
15.15 V nom
15.2 V nom
Resolution
270VDC
ADC:16.6.1.2
ripple voltage
Not included
Requires additional equipment
28VDC
ADC:16.6.1.2
> 5 kHz ripple voltage Test skipped
Requires additional equipment
28VDC
BDC:16.6.1.2
> 5 kHz ripple voltage Test skipped
Requires additional equipment
28VDC
ZDC:16.6.1.2
> 5 kHz ripple voltage Test skipped
Requires additional equipment
14VDC
ADC:16.6.1.2
> 5 kHz ripple voltage Test skipped
Requires additional equipment
14VDC
BDC:16.6.1.2
> 5 kHz ripple voltage Test skipped
Requires additional equipment
14VDC
ZDC:16.6.1.2
> 5 kHz ripple voltage Test skipped
Requires additional equipment
14VDC
ADC:16.6.2.1
10.25 V nom
10.3 V nom
Resolution
14VDC
BDC:16.6.2.1
10.25 V nom
10.3 V nom
Resolution
14VDC
ZDC:16.6.2.1
10.25 V nom
10.3 V nom
Resolution
14VDC
ADC:16.6.2.4
23.15V in transient
23.2V in transient
Resolution
3.1.2
i/iX Series
–DO160 Option Limitations
The extent of coverage of the
–160 option as implemented on the iX Series platform is shown in the
table below. Tests marked with an „x‟ generally require additional hardware to be used. Tests marked
„N/A‟ are not applicable to the corresponding table. Tests marked with a „
‟ are covered by the –160
option. Tests marked with a „P‟ require arbitrary waveform capability, which is available on iX models
only. Tests marked with an “I” are available on the i/iX products only. Tests marked with a „C‟ are
available on the Compact iX products only.
No.
115V Tests
Description
Table
A(CF)
Table
A(NF)
Table
A(WF)
No.
28 VDC Tests
Description
Table
ADC
Table
BDC
Table
ZDC
16.5.1.1
Voltage and
Frequency
16.6.1.1
Voltage
16.5.1.2
Voltage Modulation
16.6.1.2
Ripple Voltage
I, P
I, P
I, P
16.5.1.3
Frequency
Modulation
16.6.1.3
Momentary Power
Interruptions