AMETEK Compact i/iX Series Software Manual - Manual (Page 105)

User Manual - Rev H California Instruments
Avionics Software 105
5.1.2.1 Specific Test Limitations and Discrepancies
While every effort has been made to provide comprehensive coverage of the Mil-Std 704 tests, some
limitations apply, largely due to hardware limitations of the iX power source. The following table lists
specific implementation issues by test number. The deviation from the standard requirement is shown
in the “Actual setting” column. The reason for the deviation is shown in the last column.
Rev Test Std requirement Actual setting Reason
A SAC104 .5Vp-v modulation (.3536V RMS) .4V RMS modulation Resolution
A SAC104 3.5Vp-v modulation (2.475V RMS) 2.4V RMS modulation Resolution
A TAC104 .5Vp-v modulation (.3536V RMS) .4V RMS modulation Resolution
A TAC104 3.5Vp-v modulation (2.475V RMS) 2.4V RMS modulation Resolution
A-F SAC106 50kHz Test skipped Requires additional equipment
A-F TAC106 50kHz Test skipped Requires additional equipment
A-F LDC103 50kHz Test skipped Requires additional equipment
A-F LDC104 16.8kHz Test skipped Requires additional equipment
B-F SAC104 .375V RMS modulation .4V RMS modulation Resolution
B-F SAC104 2.5V RMS modulation 2.4V RMS modulation Resolution
B-F TAC104 .375V RMS modulation .4V RMS modulation Resolution
B-F TAC104 2.5V RMS modulation 2.4V RMS modulation Resolution
B-F HDC103 50kHz Test skipped Requires additional equipment
B-F HDC104 16.8kHz Test skipped Requires additional equipment
F SVF104 .375V RMS modulation .4V RMS modulation Resolution
F SVF104 2.5V RMS modulation 2.4V RMS modulation Resolution
F SVF106 50kHz Test skipped Requires additional equipment
F TVF104 .375V RMS modulation .4V RMS modulation Resolution
F TVF104 2.5V RMS modulation 2.4V RMS modulation Resolution
F TVF106 50kHz Test skipped Requires additional equipment
F SXF104 .375V RMS modulation .4V RMS modulation Resolution
F SXF104 2.5V RMS modulation 2.4V RMS modulation Resolution
F SXF106 50kHz Test skipped Requires additional equipment
F SXF109 Dwell time = 1 cycle (16.666667 msec) Dwell time = 17msec Resolution
F SXF201 Dwell time = 1 cycle (16.666667 msec) Dwell time = 17msec Resolution
F SXF302 Dwell time = 1 cycle (16.666667 msec) Dwell time = 17msec Resolution
F HDC105 1 330VDC 300VDC limit (test written but will not run) Hardware limit DC range i/iX
F HDC302
3
350VDC 300VDC limit (test written but will not run) Hardware limit DC range i/iX
B, C HDC105 475VDC 300VDC limit (test written but will not run) Hardware limit DC range i/iX
B, C HDC302 475VDC 300VDC limit (test written but will not run) Hardware limit DC range i/iX
B, C SAC105 +/-1.75Hz modulation +/-2Hz modulation Resolution
B, C SAC105 +/-0.85Hz modulation +/-0.9Hz modulation Resolution
B, C SAC105 +/-0.58Hz modulation +/-0.6Hz modulation Resolution
B, C TAC105 +/-1.75Hz modulation +/-2Hz modulation Resolution
B, C TAC105 +/-0.85Hz modulation +/-0.9Hz modulation Resolution
B, C TAC105 +/-0.58Hz modulation +/-0.6Hz modulation Resolution
1
Note: To perform MIL-STD-704F tests HDC105-1, -3 and HDC302-1, -3, it is advised to use the firmware revision E
tests TRANSIENT and ABNORMAL respectively. The –704 firmware implementation overrides the DC voltage range
hardware limit making it possible for these tests to be performed. If the i/iX system is a Series II system, the DC limit is
400V so this limitation does not apply. The same does not apply to the equivalent rev B or rev C tests, which require
475VDC. The 475 VDC level is not supported on any of the i/iX Series.