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Specific test limitations and discrepancies, I/ix series -704 option limitations – AMETEK Compact i/iX Series Software Manual User Manual

Page 103

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User Manual - Rev H

California Instruments

Avionics Software

103

5.1.1.1

Specific Test Limitations and Discrepancies

While every effort has been made to provide comprehensive coverage of the Mil-Std 704 tests, some
limitations apply, largely due to hardware limitations of the MX power source. The following table lists
specific implementation issues by test number. The deviation from the standard requirement is shown
in the “Actual setting” column. The reason for the deviation is shown in the last column.

Rev

Test

Standard requirement

Actual setting

Reason

A

SAC104

.5Vp-v modulation (.3536V RMS)

.4V RMS modulation

Resolution

A

SAC104

3.5Vp-v modulation (2.475V RMS)

2.4V RMS modulation

Resolution

A

TAC104

.5Vp-v modulation (.3536V RMS)

.4V RMS modulation

Resolution

A

TAC104

3.5Vp-v modulation (2.475V RMS)

2.4V RMS modulation

Resolution

A-F

SAC106

50kHz

Test skipped

Requires additional equipment

A-F

TAC106

50kHz

Test skipped

Requires additional equipment

A-F

LDC103

50kHz

Test skipped

Requires additional equipment

A-F

LDC104

16.8kHz

Test skipped

Requires additional equipment

B-F

SAC104

.375V RMS modulation

.4V RMS modulation

Resolution

B-F

SAC104

2.5V RMS modulation

2.4V RMS modulation

Resolution

B-F

TAC104

.375V RMS modulation

.4V RMS modulation

Resolution

B-F

TAC104

2.5V RMS modulation

2.4V RMS modulation

Resolution

B-F

HDC103 50kHz

Test skipped

Requires additional equipment

B-F

HDC104 16.8kHz

Test skipped

Requires additional equipment

F

SVF104

.375V RMS modulation

.4V RMS modulation

Resolution

F

SVF104

2.5V RMS modulation

2.4V RMS modulation

Resolution

F

SVF106

50kHz

Test skipped

Requires additional equipment

F

TVF104

.375V RMS modulation

.4V RMS modulation

Resolution

F

TVF104

2.5V RMS modulation

2.4V RMS modulation

Resolution

F

TVF106

50kHz

Test skipped

Requires additional equipment

F

SXF104

.375V RMS modulation

.4V RMS modulation

Resolution

F

SXF104

2.5V RMS modulation

2.4V RMS modulation

Resolution

F

SXF106

50kHz

Test skipped

Requires additional equipment

F

SXF109

Dwell time = 1 cycle (16.666667 msec) Dwell time = 17msec

Resolution

F

SXF201

Dwell time = 1 cycle (16.666667 msec) Dwell time = 17msec

Resolution

F

SXF302

Dwell time = 1 cycle (16.666667 msec) Dwell time = 17msec

Resolution

B, C

HDC105 475VDC

400VDC limit (test written but will not run) Hardware limit DC range MX

B, C

HDC302 475VDC

400VDC limit (test written but will not run) Hardware limit DC range MX

B, C

SAC105

+/-1.75Hz modulation

+/-2Hz modulation

Resolution

B, C

SAC105

+/-0.85Hz modulation

+/-0.9Hz modulation

Resolution

B, C

SAC105

+/-0.58Hz modulation

+/-0.6Hz modulation

Resolution

B, C

TAC105

+/-1.75Hz modulation

+/-2Hz modulation

Resolution

B, C

TAC105

+/-0.85Hz modulation

+/-0.9Hz modulation

Resolution

B, C

TAC105

+/-0.58Hz modulation

+/-0.6Hz modulation

Resolution

5.1.2

i/iX Series -704 Option Limitations

The extent of coverage of the

–704 option as implemented on the IX Series platform is shown in the

table below. Tests marked with an

„x‟ generally require additional hardware to be used. Tests marked

„N/A‟ are not applicable to the corresponding table. Tests marked with a „

‟ are covered by at least

one rev of the MIL-STD-704.

Tests marked with a „P‟ require arbitrary waveform capability, which is

available on iX models only.

No.

Description

Table

SAC

Table

TAC

Table

SVF

Table

TVF

Table

SXF

No.

Description

Table

LDC

Table

HDC

101

Load and Current
Harmonic
Measurements

101

Load Measurements