INFICON XTC/C Thin Film Deposition Controller - Manual (Page 108)

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XTC/C - XTC/2 Operating Manual
Figure 4-4 Display Loop
The Measurement and Control Loop is characterized by its time-critical nature.
No matter what else is happening, the instrument will measure the crystal’s
frequency and update the Control Loop voltage and all other outputs every 250
milliseconds.
Cable compensation processing is used to match the crystal, transducer, feed
through and in-vacuum cables to the drive circuit.
Sweep processing frequency scans the system for the fundamental resonance
of the crystal. Once this resonance is found normal frequency tracking is
implemented.