Agilent Technologies N9010A - Manual (Page 208)

208 Chapter 22
cdma2000 Measurement Application
Measurements
Description Specification Supplemental Information
Occupied Bandwidth
Minimum carrier power at RF Input
−30 dBm (nominal)
Frequency accuracy
±2 kHz (nominal)
RBW = 30 kHz,
Number of Points = 1001,
Span = 2 MHz
Description Specifications Supplemental Information
Spectrum Emission Mask
a
Dynamic Range, relative
750 kHz offset 73.6 dB 81.0 dB (typical)
1980 kHz offset 78.3 dB 83.9 dB (typical)
Sensitivity, absolute
b
750 kHz offset
−94.7 dBm −100.7 dBm (typical)
1980 kHz offset
−94.7 dBm −100.7 dBm (typical)
Accuracy
750 kHz offset
Relative
c ±0.09 dB
Absolute
d
20 to 30
°C ±1.05 dB ±0.31 dB (at 95th percentile)
1980 kHz offset
Relative
c ±0.10 dB
Absolute
d
20 to 30
°C ±1.05 dB ±0.31 dB (at 95th percentile)
a. SEM test items compliance the limits of conducted spurious emission specification defined in 3GPP2
standards.
b. The sensitivity is specified with 0 dB input attenuation. It represents the noise limitations of the ana-
lyzer. It is tested without an input signal. The sensitivity at this offset is specified for the default 30 kHz
RBW, at a center frequency of 2 GHz.
c. The relative accuracy is a measure of the ration of the power at the offset to the main channel power. It
applies for spectrum emission levels in the offsets that are near the regulatory limits of –25 dBc at
750 kHz offset and –60 dBc at 1980 kHz offset.
d. The absolute accuracy of SEM measurement is the same as the absolute accuracy of the spectrum ana-
lyzer. See Absolute Amplitude Accuracy for more information. The numbers shown are for 0 to
3.6 GHz, with attenuation set to 10 dB.