2 automatic test pattern generation (atpg), 1 arm720t processor intest/extest wrapper, Atpg – Epson ARM.POWERED ARM720T User Manual
Page 186: Automatic test pattern generation (atpg) -2, Table 11-1, Summary of atpg test signals -2

11: Test Support
11-2
EPSON
ARM720T CORE CPU MANUAL
11.2
Automatic Test Pattern Generation (ATPG)
Scan insertion is already performed and fixed for the ARM720T processor. You can use
Automatic Test Pattern Generation
(ATPG) tools to create the necessary scan patterns to test
the logic outputs from all registers.
A summary of ARM720T ATPG test signals is shown in Table 11-1.
In ATPG mode, the HRESETn, DBGnTRST, and TESTENABLE signals are constrained to 1.
The TESTENABLE signal only goes inside the internal clock module and ensures that all scan
flip flops in the design are using the same phase. There are no lock-up latches between two
functional clock domains.
11.2.1
ARM720T processor INTEST/EXTEST wrapper
In addition to the auto-inserted scan chains, the ARM720T processor includes all the signals
for an optional INTEST/EXTEST scan chain, scan chain 0.
ATPG
Seven balanced scan chains are provided for ATPG, along with a test enable and a single scan
enable.
Table 11-1 Summary of ATPG test signals
Test signals
Direction
Description
TESTENABLE
Input
This signal ensures the clocks are free-running during
scan test. TESTENABLE must be:
tied HIGH throughout the duration of scan testing
tied LOW during functional mode.
SCANENABLE
Input
This signal enables serial shifting of vectors through the
scan chains. You must control this signal using the I/O
pins. It must be tied LOW during functional mode.
SCANIN0-SCANIN6
Inputs
Processor core scan chain inputs.
SCANOUT0-SCANOUT6
Outputs
Processor core scan chain outputs.
HCLK
Input
System clock. All signals are related to the rising edge
of HCLK.
HCLKEN
Input
Synchronous enable for AHB transfers. When HIGH,
indicates that the next rising edge of HCLK is also a
rising edge for the AHB system that the ARM720T
processor is embedded in. Must be tied HIGH in
systems where the AMBA bus and the core are
intended to be the same frequency.
DBGTCKEN
Input
Synchronous enable for debug logic. Must be tied HIGH
during scan test.
HRESETn
Input
This is the active LOW reset signal for the system and
bus.
DBGnTRST
Input
This is the active LOW reset signal for the internal state.
This signal is a level-sensitive asynchronous reset
input.