Epson ARM.POWERED ARM720T - Manual (Page 185)

11: Test Support
ARM720T CORE CPU MANUAL EPSON 11-1
11 Test Support
This chapter describes the test methodology and the CP15 test registers for the ARM720T
processor synthesized logic and TCM. It contains the following sections:
11.1 About the ARM720T test registers...........................................................11-1
11.2 Automatic Test Pattern Generation (ATPG)............................................11-2
11.3 Test State Register ....................................................................................11-3
11.4 Cache test registers and operations .........................................................11-3
11.5 MMU test registers and operations..........................................................11-8
11.1 About the ARM720T test registers
Coprocessor 15 register c15 of the ARM720T processor is used to provide device-specific test
operations. You can use it to access and control the following:
• Test State Register on page 11-3
• Cache test registers and operations on page 11-3
• MMU test registers and operations on page 11-8.
You must only use these operations for test. The ARM Architecture Reference Manual
describes this register as implementation defined.
The format of the CP15 test operations is:
MCR/MRC p15, opcode_1, , c15, ,
Figure 11-1 CP15 MRC and MCR bit pattern
The L bit distinguishes between an MCR (L set to 1) and an MRC (L set to 0).
31 14 13 12 10 09 08 07 06 05 04 03 02 01 00
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