KEYENCE LK-G Series - Manual (Page 65)

3-7
3
LK-G-M-NO3-E
3 Function Settings
Setting the Measurement Mode According to the Measuring Target
Specifying the features of the measuring target stabilizes the detection.
Select the corresponding type from the following list.
• To obtain optimal control over detection of the four surfaces, the sampling rate of [Transparent
object 2] is quadrupled at maximum. Be sure to attach the ND filter ( page 1-9).
• When selecting the transparent object, transparent object 2, or multi-reflective object, set
the sampling rate ( page 3-39) to other than 20 µs (other than 20 µs and 50 µs when
transparent object 2 is selected in the LK-G85/G80/G87/G82/G155/G150/G157/G152/
G405/G400/G407/G402, and other than 20 µs, 50 µs and 100 µs when transparent object 2
is selected in the LK-G505/G500/G507/G502).
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Setting procedure of the measurement mode
1
Hold down the key, and select " kEAd-A " with the key.
"Head A" is set in this example.
2
Press the key, and select function " b " with the key.
Set the measurement mode.
3
Press the key, and select " b-2 " with the key.
"Transparent object" is selected in this example.
4
Press the key to register the setting. Press the
key to return to the measurement state.
Function No. Target workpiece Description
b-0 nor al Normal Select this setting in normal cases.
b-1 kalf-t Translucent object Used for a target that absorbs light such as a translucent r esin.
b-2 tran-1 Transparent object Used for displacement measurement or thickness
measurement of a transparent object.
Used when the reflective ratio of multiple surfaces on a
transparent object is the same.
b-3 tran-2 Transparent object 2 Used when the reflective ratio of the multiple surfaces (up to
four phases) on the transparent object is different.
b-4 rs Multi-reflective
object Used to measure the bending of an IC or connector terminal.
Note
OUT1 HI GO LO
HI GO LO
TIM
OUT2 TIM
OUT1 HI GO LO
HI GO LO
TIM
OUT2 TIM
OUT1 HI GO LO
HI GO LO
TIM
OUT2 TIM