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Tolerances, 4 tolerances, Section 6.2.4 – SMA Sunny Boy Control User Manual

Page 73: Refer to section 6.2.4), N 6.2.4, Warning time, 15min, Warning rate, Offline… š ………………30min, Energy

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Sunny Boy Control

SMA Technologie AG

User Manual

SUNBC-14:NE0206

69

6.2.4 Tolerances

In the “TOLERANCES” menu, you can set the thresholds that will cause the Sunny Boy
Control to generate messages for a device (refer to section “6.3.3 Alarm Contact”).

[ TOLERANCES ]

‡Warning Time…

………………15min

Timespan before generating a warning message

Warning Rate

………………100%

Percentage how long the failure appears within the indecated timespan

Offline… Š
………………30min

Maximum timespan during which a device may not be reached

Energy…

………………50%

Percentage yield expected of a device compared with the average

Communication…

………………50%

Expected communication quality

RIso Failure…

……………500kOhm

Minimum insulation resistance

Fig. 6.8: Adjusting tolerances

Once a warning or error message has been generated for a device, you can use the
diagnostic functions to troubleshoot the problem (refer to section 5).

The time value under “Warnings” indicates how long a failure must be present be-
fore the Sunny Boy Control generates a warning message.

The time value under “Offline” indicates how long in a day a device may not be
accessible during operating hours (i.e., between the time the device was switched on
and the time the last device is switched off). The smallest offline setting is 15 minutes.

The percentage under “Energy” indicates the minimum daily energy yield expected
of a device compared with the average of all other similar devices. Since the daily
energy data of the system becomes available only at the end of the day, this com-
parison can take place only at that time. If the daily energy yield of the device falls
short of the set percentage, an error message will be generated for the device. This
allows you to check whether the devices are operating well enough. It is advisable
not to set the energy tolerance percentage too high, since deviations in the yield of
arrays placed in different locations are normal. To obtain meaningful energy yield
comparisons, the compared devices must be of the same type.

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