Maxim Integrated MAX31782 - Manual (Page 132)

MaximIntegrated 16-4
MAX31782 User’s Guide
Revision 0; 8/11
16.2TAPStateControl
The TAP provides an independent serial channel to communicate synchronously with the host system . The TAP state
control is achieved through host manipulation of the test mode select (TMS) and test clock (TCK) signals . The TMS
signal is sampled at the rising edge of TCK and decoded by the TAP controller to control movement between the TAP
states . The TDI input and TDO output are meaningful once the TAP is in a serial shift state (i .e ., Shift-IR or Shift-DR) .
16.2.1Test-Logic-Reset
On a power-on reset, the TAP controller is initialized to the Test-Logic-Reset state and the instruction register (IR[2:0])
is initialized to the Bypass instruction so that it does not affect normal system operation . No matter what the state of the
controller, it enters Test-Logic-Reset when TMS is held high for at least five rising edges of TCK . The controller remains
in the Test-Logic-Reset state if TMS remains high . An erroneous low signal on the TMS can cause the controller to move
into the Run-Test-Idle state, but no disturbance is caused to system operation if the TMS signal is returned and kept
at the intended logic-high for three rising edges of TCK, since this returns the controller to the Test-Logic-Reset state .
16.2.2Run-Test-Idle
As illustrated in Figure 16-2 , the Run-Test-Idle state is simply an intermediate state for getting to one of the two state
sequences in which the controller performs meaningful operations:
• Controller state sequence (IR-Scan) or
• Data register state sequence (DR-Scan)
16.2.3IR-ScanSequence
The controller state sequence allows instructions (e .g ., Debug and System Programming) to be shifted into the instruc-
tion register starting from the Select-IR-Scan state . In the TAP, the instruction register is connected between the TDI
input and the TDO output . Inside the IR-Scan Sequence, the Capture-IR state loads a fixed binary pattern (001b) into the
3-bit shift register and the Shift-IR state causes shifting of TDI data into the shift register and serial output to TDO, least
significant bit first . Once the desired instruction is in the shift register, the instruction can be latched into the parallel
instruction register (IR[2:0]) on the falling edge of TCK in the Update-IR state . The contents of the 3-bit instruction shift
register and parallel instruction register (IR[2:0]) are summarized with respect to the TAP controller states in
Table 16-2 .
Table16-2.InstructionRegisterContentvs.TAPControllerState
TAPCONTROLLER
STATE
INSTRUCTIONSHIFTREGISTER
PARALLEL(3-BIT)
INSTRUCTIONREGISTER(IR[2:0])
Test-Logic-Reset Undefined Set to Bypass (011b) Instruction
Capture-IR Load 001b at the rising edge of TCK Retain last state
Shift-IR
Input data via TDI and Shift towards TDO at the ris-
ing edge of TCK
Retain last state
Exit1-IR
Exit2-IR
Pause-IR
Retain last state Retain last state
Update-IR Retain last state Load from shift register at the falling edge of TCK
All other states Undefined Retain last state