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Single-step test configuration, Overview – GW Instek LCR-8101 (Replaced by LCR-8101G) User Manual

Page 60

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LCR-8000G Series User Manual

60

Single-Step Test Configuration

Overview

Background / test
type

Pass/Fail test checks whether the measurement
result sits between the Hi(high) and Lo(low) limit.
Three methods are available: absolute limit,
percentage and delta limit.

Absolute

limit

The Hi and Lo limit are defined by
absolute values.

Lo
Limit

Hi
Limit

Pass

Percentage

limit

The Hi and Lo limit are defined by the
distance (percentage) from the
Nominal value.

Nominal

– ##%

Pass

Nominal

Nominal
+ ##%

Delta

limit

The Hi and Lo limit are defined by the
difference from the nominal value.

Test item

C

S

Series capacitance X Reactance

C

P

Parallel
capacitance

B

Susceptance

L

S

Series inductance Z Impedance

L

P

Parallel inductance Y Admittance

R

S

Series resistance

R

DC

DC Resistance