Appendix f, Levelflex m guided radar level, Appendix – Rockwell Automation 1734sc-IE4CH E+H Instruments via HART to PlantPAx User Manual User Manual
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Rockwell Automation Publication PROCES-UM002A-EN-P - July 2014
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Appendix
F
Levelflex M Guided Radar Level
Levelflex instruments are "downward-looking" measuring systems that function
according to the ToF method (ToF = Time of Flight). The distance from the
reference point (process connection of the measuring device) to the product
surface is measured. High-frequency pulses are injected to a probe and led along
the probe. The pulses are reflected by the product surface, received by the
electronic evaluation unit and converted into level information. This method is
also known as TDR (Time Domain Reflectometry).
Topic
Page
Connect a Levelflex M Guided Level-Radar
Configure a Levelflex M Guided Level-Radar
Component
Catalog Number
Details
Levelflex M guided level-radar
FMP40-APR2CNJB21CA
Firmware revision 1.04
- 1734sc-IE2CH E+H Instruments via HART to PlantPAx User Manual 1769sc-IF4IH E+H Instruments via HART to PlantPAx User Manual 1794-IF8IH E+H Instruments via HART to PlantPAx User Manual 1756-IF16H E+H Instruments via HART to PlantPAx User Manual 1756-IF8IH E+H Instruments via HART to PlantPAx User Manual 1756-IF8H E+H Instruments via HART to PlantPAx User Manual