HEIDENHAIN IK 5394-3D - Manual (Page 240)

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Chapter 3 Probes
Probe Calibration
There are two factors that influence probe measurements: the radius of the
probe tip and the spatial (X, Y, and Z) position of the probe tip. All measure-
ments are based on the location of the center of the probe tip. Probe compensa-
tion applies a calculation to correct for the radius of the probe on each measure-
ment. The compensation for each probe tip is calculated automatically when
the probe is taught.
Click on the TouchProbe group and observe the probes in the right-hand data
box. The following information appears in the probe data box by default name
of the probe, date of probe qualification, and the name of the person who per-
formed the qualification.
NOTE
The date and the name of the person qualifying the probe are
taken from the Windows system clock and login respectively.
Probe qualification, or probe teaching, refers to the process of establishing the
dimension of the probe tip. This process typically involves taking a number of
probe hits on a qualification sphere with a known diameter. Qualifying, or
teaching, a probe also provides offsets for probe compensation.