AMETEK CTS 3.0 - Manual (Page 95)

User Manual Compliance Test System 3.0
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7. IEC 61000-4-11 Voltage Dips and Variations Immunity Testing
7.1 About This Chapter
This chapters covers testing a device for compliance with the IEC 61000-4-11 Voltage Dips and
Variations test standard. This test is supported through the CIGui32 or CIGuiSII AC source control
program. If you purchased a 100-CTS or 300-CTS test system, which does not include a
California Instruments AC source, you will not be able to perform these tests.
The CIGui32 or CIGuiSII supports two implementations of the IEC 61000-4-11 test standard, one
based on the firmware option available for the i/iX Series and one implemented in the CIGui32 or
CIGuiSII program itself that can be used with any supported AC source. If you are using an i/iX
Series AC source, check your configuration window to see if this option is installed. The CIGui32
or CIGuiSII will automatically choose the correct implementation. This section covers the
implementation that relies on the presence of the -411 firmware option. This is also the version
that supports the -EOS (Electronic Output Switch) option required for AC source compliance. If
the AC source you are using does not have this option or is a 1251RP, refer to the AC source
manual instead.
7.2 Standard Revisions and EUT Classes
The –411 option supports both the first (1994-06) and the second edition (2004-03) of the IEC
61000-4-11 test standard as of firmware revision 2.38. Older firmware revisions only support the
first edition. Contact
[email protected] for upgrade information. If Edition 2.0 is supported, the
standard revision can be selected when using the Cigui32 or CIGuiSII Windows program. From
the front panel, there is no need to select the revision but data values can be set that support
either version of the standard.
Generic tests files are distributed with the CIGui32 or CIGuiSII program for both editions of the
test standard. Files applicable to Edition 2.0 have ED20 in their file name. Do not mix these files,
as the data setup will not be correct if you do. To load a test file, select the Mode (Dips or Vars)
and test standard revision first, then use the File, Open menu to load the test parameters. Test
parameters can be a function of the EUT class. The different files provided with the program
cover the various EUT classes. The relevant EUT class 1, 2, 3 or X is listed in the file names.
When using front panel operation, the user has to set levels for each individual test step in
SINGLE mode.
7.3 Compliance Statement
Based on the hardware specifications of the AC source in use, not all requirements for IEC
61000-4-11 test generators may be met. In particular, the 1 to 5 microsecond rise and fall time
called out in the specification is not met by most AC sources. This is unlikely to have any effect on
the outcome of the test however. A unit that fails a voltage dropout with a 80 microsecond rise and
fall time will not likely pass the same dropout performed at 5 microseconds rise and fall times and
vice versa.
However, the -EOS option available for the iX Series AC sources may be added to meet the IEC
61000-4-
11 source‟s rise and fall times.
Also, the 500 Amps inrush current capability is not met. This requirement does not have to be met
if the unit under test does not draw more inrush current than the AC source can deliver. The peak
current pre-test option may be used to verify inrush capability of the source for the unit under test.