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Iec 61000-4-14 voltage fluctuations, Iec 61000-4-17 dc ripple, Iec 61000-4-27p three phase voltage unbalance – AMETEK CTS 3.0 User Manual

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User Manual

Compliance Test System 3.0

25

Californi

a Instruments‟ CTS system supports IEC 61000-4-11 testing using an iX Series AC power

source. For full AC Source compliance, the EOS1 or EOS3 Electronic Output Switch option is
required. Non iX Series based CTS systems offer pre-compliance testing of IEC 61000-4-11 only.
The test sequencer and report generation for IEC 61000-4-11 is provided through the CIGUI32 or
CIGuiSII Windows software. To accommodate changes in the specification, test levels and
duration can be set by the operator or loaded from disk if needed.

2.8

IEC 61000-4-13 Interharmonics and Harmonics Immunity Test

The IEC413 option is capable of performing IEC 61000-4 section 13 Harmonics and inter
harmonics low frequency immunity tests. The tests are based on IEC 61000-4-13:2002-03, First
Edition. It is assumed that the user has a copy of the test standard available. This manual section
only cover operation of the

–413 option from the front-panel of the iX Series power source.

Note 1: The initial release of the

–413 option for the iX Series power sources was based on a

draft version (CDV) of the IEC 61000-4-13 standard. Minor changes were made between the CDV
draft and the final released version. Units with firmware revision 2.37 or higher conform to the
official released IEC standard. Units with older firmware conform to the draft version. A firmware
upgrade can be ordered through California Instruments‟ service department by contacting

[email protected]

and requesting part number CIC463. Provide the model and serial number

of the unit (master unit in multi-box systems) to ensure the correct firmware is provided. The
firmware revision is displayed on the LCD screen immediately after power up for a few seconds. It
can also be queried over the bus using

the “*IDN?” command.

Where relevant, the requirement for the correct firmware revision to obtain specific test modes is
indicated in this manual.

Note 2: The

–413 option is only available on iX Series AC power sources, not i Series. It is

possible to upgrade most i Series AC source to an iX Series and add the

–413 option. Contact the

California Instruments service department for information.

[email protected]

2.9

IEC 61000-4-14 Voltage Fluctuations

The IEC 61000-4-14 is aimed at testing a product for immunity against voltage fluctuations that
can occur on the public utility. The nature of the voltage fluctuations is different from those tested
under IEC 61000-4-11 however. The fluctuations covered in this standard are less severe and
involve typical high and low line conditions.

California Instruments‟ CTS system supports full compliance IEC 61000-4-14 testing on all iX
Series based CTS systems. The IEC 61000-4-14 test is implemented in the CIGUI32 or CIGuiSII
Windows software. To accommodate changes in the specification, test levels and duration can
be changed by the operator or loaded from disk if needed. Non iX Series based CTS systems
offer pre-compliance testing of IEC 61000-4-14 only.

2.10

IEC 61000-4-17 DC Ripple

The IEC 61000-4-17 is aimed at testing a DC powered product for immunity against voltage ripple.
Ripple is often caused by feed-through from the AC input section of a DC supply and exhibits itself
as a small AC signal riding on the DC output. The IEC 61000-4-17 standards covers test levels
and frequencies for testing the immunity of DC products against such phenomena.

The CTS system supports full compliance IEC 61000-4-17 testing (iX Series based CTS systems
only). The IEC 61000-4-17 test is implemented in the CIGUI32 or CIGuiSII Windows software.
To accommodate changes in the specification, test levels and duration can be changed by the
operator or loaded from disk if needed. Non iX Series based CTS systems do not offer this test.

2.11

IEC 61000-4-27p Three Phase Voltage Unbalance

Three phase CTS systems support pre-compliance IEC 61000-4-27 testing. The IEC 61000-4-27
test is implemented in the CIGUI32 OR CIGUISII Windows software. To accommodate changes
in the specification, test levels and duration can be changed by the operator or loaded from disk if
needed.