De-energize-to-trip 5-year proof test interval – Rockwell Automation 1715-OF8I Redundant I/O System User Manual User Manual
Page 301
Rockwell Automation Publication 1715-UM001C-EN-P - March 2014
301
PFD and PFH Calculations for a SIL 2 System
Appendix E
The PFD calculations in
are calculated for a 5-year proof test interval
(43,800 hours) and are specific to1715 I/O components in ControlLogix
systems.
De-energize-to-trip 5-year Proof Test Interval
Table 74 - De-energize-to-trip 5-year Proof Test Interval
MTTR 24 Hours
PTI 5.0 Years
Simplex Configuration
Duplex Configuration
Ca
t N
o.
Se
rie
s
Fi
rm
wa
re
Ve
rs
io
n
De
scr
ip
tio
n
MT
BF
λs
λdu
λdd
SF
F
tce
'
HFT
PFH
de
PFDde
ST
R
β
βd
tce
'
tge'
HFT
PFH
de
PFDde
Arch
ST
R
1715-
AENTR
A
2.001 EtherNet
adapter
dual
module
84
1,973
8.43
E-
07
9.82
E-
09
3.34
E-
07
97
.74%
N/A
N/A
N/A
N/A
N/A
1.0
%
1.0
%
5.44
E+
02
3.71
E+
02
1
3.47
E-
09
2.24
E-
06
1oo2
D
8.43
E-
08
1715-
IB16D
A
2.001 16-channel
digital
input
module
3,5
35,79
1
2.06
E-
07
6.57
E-
10
7.60
E-
08
99
.77%
2.12
E+
02
0
7.48
E-
10
1.82
E-
05
2.82
E-
07
1.0
%
0.5
%
7.53
E+
01
5.82
E+
01
1
4.77
E-
10
2.13
E-
06
1oo2
D
2.06
E-
09
1715-
IF16
A
2.001 16-channel
analog
input
module
3,5
35,79
1
2.0
6E-07
6.5
7E-10
7.6
0E-08
99
.77%
2.12
E+
02
0
7.4
8E-10
1.8
2E-05
2.8
2E-07
1.0
%
0.5
%
7.53
E+
01
5.82
E+
01
1
4.7
7E-10
2.1
3E-06
1oo2
D
2.0
6E-09
1715-
OB8DE
A
2.001 16-channel
digital
output
module
9,67
7,08
5
7.94
E-08
2.96
E-10
2.36
E-08
99
.26%
2.95
E+0
2
1
7.68
E-10
6.97
E-06
1.03
E-07
1.0%
1.0%
N/A
N/A
1
1.54
E-09
1.39
E-05
2oo2
7.94
E-10
1715-
OF8I
A
2.001 16-channel
analog
output
module
5,44
6,17
9
1.34
E-07
5.50
E-10
4.96
E-08
99
.51%
2.64
E+0
2
1
9.13
E-10
1.33
E-05
1.83
E-07
1.0%
0.5%
N/A
N/A
1
1.82
E-09
2.64
E-05
2oo2
1.34
E-09