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Ocean Optics NanoCalc User Manual

Page 63

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Ocean Optics Germany GmbH Thin Film Metrology

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example 2:
you want to measure a thin film of Si3N4 on the backside of a thick glass plate
First establish the stack: Si3N4 as substrate with a glass layer on top. Do not care about thickness values at
the moment. Then apply the command "make a thick layer". A little windows pops up, choose layer 1 (the
glass layer) as "thick". Now you also have the chance to insert the thickness of the glass plate. You are not
allowed to select "calculate backside" as this is always the case if the thick layer is not L0. Now press "ok" in
this little window (which will disappear). Now adjust all other thicknesses.

application 2: show layer commands
if this option is activated a small list of commands is shown (like PageDown, PageUp, ...)

application 3: select a layer