Ocean Optics NanoCalc - Manual (Page 5)

Ocean Optics Germany GmbH Thin Film Metrology
4
1.1 Measurement setup
A broadband white light source is reflected by a thin layer under vertical incidence (after a calibration
measurement). The reflected intensity as a function of wavelength is measured by a spectrometer, a PC
extracts the wanted information.
1.2 Measurement signal
The typical modulated signal of such a spectroscopic thin film measurement might look like this (after some
data manipulations):
NanoCalc uses this signal to extract thickness (eventually also dispersion) for this (SiO
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Fibercable
Thin Layer
NanoCalc-2000