0 dyn1 transformer test procedure (continued) – Vanguard Tri-Phase User Manual
Page 52
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TRI-PHASE OPERATING™ INSTRUCTIONS
52
14.0 Dyn1 Transformer Test Procedure (continued)
Table 6.0 Dyn1 Transformer Test Procedure (continued)
STEP DESCRIPTION
DISPLAY
ACTION
19
Select “NO” from the “Run
Another Test Menu”
RUN ANOTHER TEST?
1.YES
.
2.NO
3. REPEAT PREV. TEST
Press key number 2
Selection of 2 may be
made by turning the
Control Knob. Push
down Control Knob
after 2 is selected
20
Store test results in FLASH
EEPROM
SAVE THIS RECORD?
1.YES
.
2.NO
Press key number 1
or push down
Control Knob
21
“Record Saved” confirmation
status display
Test results saved in FLASH
EEPROM as a test record
NOTE:
The next sequential record
number (#) is automatically
assigned
RECORD NUMBER #
HAS BEEN SAVED
Press any Key or
push down Control
Knob
22
Return to “Main Menu”
1.RUN TEST
.
2.SETUP
3.TEST PLAN
4.DIAGNOSTIC
TIME: 20:15:00
DATE: 07/16/08
None
NOTE:
The precondition for the above test procedure was that no previous single-phase transformer test
record was residing in temporary memory. Once a single phase test record has been saved to
FLASH EEPROM, or a single phase test record restored from FLASH EEPROM and another single
phase transformer test is performed, select “YES” in response to “Keep This Reading” at step 17
results in the display of the following menu.
PREVIOUS DATA IN BUF.
1.APPEND PREV. DATA
.
2.CLEAR PREV. DATA
The “PREVIOUS DATA IN BUF.” menu is displayed when previous test data is stored in
temporary memory. Selecting menu option 1 (“Append Prev. Data”) will append the current test
results to the previous test data stored in temporary memory. Selecting menu option 2 (“Clear Prev.
Data”) will store only this new test data in the temporary memory (and clear the previous data). The
temporary memory will be lost when the TRI-PHASE™ is powered-off, but the test records will
remain in the TRI-PHASE™ FLASH EEPROM non-volatile internal memory.