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0 dyn1 transformer test procedure (continued) – Vanguard Tri-Phase User Manual

Page 52

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TRI-PHASE OPERATING™ INSTRUCTIONS

52


14.0 Dyn1 Transformer Test Procedure (continued)

Table 6.0 Dyn1 Transformer Test Procedure (continued)

STEP DESCRIPTION

DISPLAY

ACTION

19

Select “NO” from the “Run
Another Test Menu”

RUN ANOTHER TEST?

1.YES

.

2.NO
3. REPEAT PREV. TEST

Press key number 2
Selection of 2 may be
made by turning the
Control Knob. Push
down Control Knob
after 2 is selected

20

Store test results in FLASH
EEPROM

SAVE THIS RECORD?

1.YES

.

2.NO

Press key number 1
or push down
Control Knob

21

“Record Saved” confirmation
status display
Test results saved in FLASH
EEPROM as a test record
NOTE:
The next sequential record
number (#) is automatically
assigned

RECORD NUMBER #
HAS BEEN SAVED

Press any Key or
push down Control
Knob

22

Return to “Main Menu”

1.RUN TEST

.

2.SETUP
3.TEST PLAN
4.DIAGNOSTIC
TIME: 20:15:00
DATE: 07/16/08

None


NOTE:

The precondition for the above test procedure was that no previous single-phase transformer test
record was residing in temporary memory. Once a single phase test record has been saved to
FLASH EEPROM, or a single phase test record restored from FLASH EEPROM and another single
phase transformer test is performed, select “YES” in response to “Keep This Reading” at step 17
results in the display of the following menu.

PREVIOUS DATA IN BUF.

1.APPEND PREV. DATA

.

2.CLEAR PREV. DATA

The “PREVIOUS DATA IN BUF.” menu is displayed when previous test data is stored in
temporary memory. Selecting menu option 1 (“Append Prev. Data”) will append the current test
results to the previous test data stored in temporary memory. Selecting menu option 2 (“Clear Prev.
Data”) will store only this new test data in the temporary memory (and clear the previous data). The
temporary memory will be lost when the TRI-PHASE™ is powered-off, but the test records will
remain in the TRI-PHASE™ FLASH EEPROM non-volatile internal memory.