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10 test function, 1 types of test sources, 2 hardware controlling test function – NEC PD754144 User Manual

Page 212

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CHAPTER 7 INTERRUPT AND TEST FUNCTIONS

212

User’s Manual U10676EJ3V0UM

7.10 Test Function

7.10.1 Types of test sources

The

µPD754244 has a test source, INT2. INT2 is an edge-detection testable input.

Table 7-5. Types of Test Sources

Test Source

Internal/External

INT2

(detects falling edge of input to KR4 to KR7 pins)

External

7.10.2 Hardware controlling test function

(1) Test request and test enable flags

The test request flag (IRQ2) is set to “1” when a test request is generated (INT2). Clear this flag to “0” by

software after the test processing has been executed.

A test enable flag (IE2) is provided for the test request flag. When this flag is “1”, the standby release signal

is enabled; when it is “0”, the signal is disabled.

If both the test request flag and test enable flag are set to “1”, the standby release signal is generated.

Table 7-6 shows the signals that set the test request flags.

Table 7-6. Test Request Flag Setting Signals

Test Request Flag

Test Request Flag Setting Signal

Test Enable Flag

IRQ2

Detection of falling edge of any input to KR4/P70-KR7/P73 pins.

IE2

Edge to be detected is selected by INT2 edge detection mode

register (IM2)

(2) Hardware of key interrupts (KR4 to KR7)

Figure 7-10 shows the configuration of KR4 to KR7.

The IRQ2 setting signal is output when a specified edge is detected on either of the key interrupts. Which

pin’s falling input is selected is specified by using the INT2 edge detection mode register (IM2).

Figure 7-11 shows the format of IM2. IM2 is set by a 4-bit manipulation instruction. When the reset signal

is asserted, all the bits of this register are cleared to “0”.

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